Photovoltage Mapping on Polycrystalline Silicon Solar Cells through Potential Measurements by Atomic Force Microscopy with Piezoresistive Cantilever
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概要
- 論文の詳細を見る
The local distribution of photovoltages on polycrystalline silicon solar cells were investigated through potential measurements by atomic force microscopy with a piezoresistive cantilever operated under light illumination. As a result, a small but not negligible site dependence of photovoltage was obtained. The estimated difference in power conversion efficiency among grains reached up to 18%, although this difference could not be attributed to the difference in reflectance coefficient.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2006-03-30
著者
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Ujihara Toru
Department Of Crystalline Materials Science Graduate School Of Engineering Nagoya University
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Igarashi Takatoshi
Institute Of Industrial Science University Of Tokyo
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Takahashi Takuji
Institute of Industrial Science and Institute for Nano Quantum Information Electronics, The University of Tokyo, Meguro, Tokyo 153-8505, Japan
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Ujihara Toru
Department of Crystalline Materials Science, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
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