Sample-and-Hold Imaging for Fast Scanning in Atomic Force Microscopy
スポンサーリンク
概要
- 論文の詳細を見る
We have proposed to use a sample-and-hold circuit for direct monitoring of cantilever deflection signals as a novel method for fast imaging in an intermittent contact mode atomic force microscopy (AFM). This method enables us to construct a quasi-topographic image from tip heights at moments when the tip taps on a sample surface. As a result, we obtained the tip height image well corresponding to the sample topography at a scanning rate above 30 Hz/line without any other customization on both a cantilever and a piezo scanner in a commercial AFM system.
- 2004-04-15
著者
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Ono Shiano
Institute Of Industrial Science University Of Tokyo
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Takahashi Takuji
Institute of Industrial Science and Institute for Nano Quantum Information Electronics, The University of Tokyo, Meguro, Tokyo 153-8505, Japan
関連論文
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- Photoabsorption Characterization on Surface InAs Nanostructures Using Light-Illuminated Scanning Tunneling Microscopy
- Light-Illuminated STM Studies on InAs Nano-Structures
- Photoabsorption Properties in InAs Wire Structures Investigated by Dual Light Illumination Method in Scanning Tunneling Microscopy
- Photoassisted Kelvin Probe Force Microscopy on Multicrystalline Si Solar Cell Materials
- Local Characterization of Photovoltage on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever
- Formation of Ultra-low Density (${\leq}10^{4}$ cm-2) Self-Organized InAs Quantum Dots on GaAs by a Modified Molecular Beam Epitaxy Method
- Current-Induced Magnetic Field Detection by Magnetic Force Microscopy around a GaAs/AlGaAs Mesa Stripe
- Dual Light Illumination Method in Scanning Tunneling Microscopy for Photoinduced Current Measurements on InAs Wires
- Photothermal Spectroscopic Measurements by Dual Sampling Method in Intermittent-Contact-Mode Atomic Force Microscopy
- Intermittent Bias Application in Kelvin Probe Force Microscopy for Accurate Determination of Surface Potential
- Sample-and-Hold Operation in Kelvin Probe Force Microscopy
- Lateral Averaging Effects on Surface Potential Measurements on InAs Dots Studied by Kelvin Probe Force Microscopy
- Sample-and-Hold Imaging for Fast Scanning in Atomic Force Microscopy
- Surface Potential Imaging on InAs Low-Dimensional Nanostructures Studied by Kelvin Probe Force Microscopy
- Magnetic Field Observation around Current Path by Magnetic Force Microscopy
- Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy with Piezoresistive Cantilever
- Photovoltage Mapping on Polycrystalline Silicon Solar Cells through Potential Measurements by Atomic Force Microscopy with Piezoresistive Cantilever
- Dual-Bias Modulation Method for Scanning Tunneling Spectroscopy