Ono Shiano | Institute Of Industrial Science University Of Tokyo
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概要
関連著者
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Ono Shiano
Institute Of Industrial Science University Of Tokyo
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Takahashi Takuji
Institute of Industrial Science and Institute for Nano Quantum Information Electronics, The University of Tokyo, Meguro, Tokyo 153-8505, Japan
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Takeuchi Misaichi
Semiconductors Laboratory The Institute Of Physical And Chemical Research (riken)
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Noda Takeshi
Institute Of Industrial Science University Of Tokyo
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Takahashi T
Department Of Electronic Engineering Kogakuin University
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ONO Shiano
Institute of Industrial Science, University of Tokyo
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TAKEUCHI Misaichi
Semiconductors Research Laboratory, RIKEN (The Institute of Physical and Chemical Research)
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TAKAHASHI Takuji
Institute of Industrial Science, University of Tokyo
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Takeuchi Misaichi
Semiconductors Research Laboratory Riken (the Institute Of Physical And Chemical Research)
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Takahashi Takuji
Institute Of Industrial Science University Of Tokyo
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Takahashi Takuji
Institute Of Industrial Science The University Of Tokyo
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Takeuchi Misaichi
Semiconductors Research Laboratory, RIKEN (The Institute of Physical and Chemical Research), 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
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Takahashi Takuji
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
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Ono Shiano
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
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Noda Takeshi
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
著作論文
- Kelvin Probe Force Microscopy for Surface Potential Measurements on InAs Nanostructures Grown on (110) GaAs Vicinal Substrates
- Intermittent Bias Application in Kelvin Probe Force Microscopy for Accurate Determination of Surface Potential
- Sample-and-Hold Operation in Kelvin Probe Force Microscopy
- Lateral Averaging Effects on Surface Potential Measurements on InAs Dots Studied by Kelvin Probe Force Microscopy
- Sample-and-Hold Imaging for Fast Scanning in Atomic Force Microscopy
- Surface Potential Imaging on InAs Low-Dimensional Nanostructures Studied by Kelvin Probe Force Microscopy