Light-Illuminated STM Studies on InAs Nano-Structures
スポンサーリンク
概要
- 論文の詳細を見る
- 2001-09-25
著者
-
Takeuchi Minoru
Joint Research Center For Atom Technology (jrcat):angstrom Technology Partnership (atp):national Ins
-
Takada Kyu
Takatsuki Laboratory Minolta Co. Ltd.
-
TAKEUCHI Misaichi
Semiconductors Research Laboratory, RIKEN (The Institute of Physical and Chemical Research)
-
TAKAHASHI Takuji
Institute of Industrial Science, University of Tokyo
-
Takeuchi Misaichi
Semiconductors Research Laboratory Riken (the Institute Of Physical And Chemical Research)
-
TAKADA Kan
Institute of Industrial Science, University of Tokyo
-
Takahashi T
Faculty Of Engineering Shizuoka University
-
Takahashi Takuji
Institute Of Industrial Science University Of Tokyo
-
Takeuchi Misaichi
Semiconductors Laboratory The Institute Of Physical And Chemical Research (riken)
-
Takahashi Takuji
Institute of Industrial Science and Institute for Nano Quantum Information Electronics, The University of Tokyo, Meguro, Tokyo 153-8505, Japan
関連論文
- Fabrication of Standard Samples for Single-Molecule Fluorescence Imaging
- Objective Lens for Blue Laser Optical Pickup with Numerical Aperture of 0.9
- Investigation of Spatial Resolution in Current-Induced Magnetic Field Detection by Magnetic Force Microscopy
- Surface Potential Imaging on InAs Low-Dimensional Nanostructures Studied by Kelvin Probe Force Microscopy
- Kelvin Probe Force Microscopy for Surface Potential Measurements on InAs Nanostructures Grown on (110) GaAs Vicinal Substrates
- Photoabsorption Characterization on Surface InAs Nanostructures Using Light-Illuminated Scanning Tunneling Microscopy
- Light-Illuminated STM Studies on InAs Nano-Structures
- Photoabsorption Properties in InAs Wire Structures Investigated by Dual Light Illumination Method in Scanning Tunneling Microscopy
- Photoassisted Kelvin Probe Force Microscopy on Multicrystalline Si Solar Cell Materials
- Local Characterization of Photovoltage on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever
- Formation of Ultra-low Density (${\leq}10^{4}$ cm-2) Self-Organized InAs Quantum Dots on GaAs by a Modified Molecular Beam Epitaxy Method
- Current-Induced Magnetic Field Detection by Magnetic Force Microscopy around a GaAs/AlGaAs Mesa Stripe
- Ge Doping Effect on Properties of AgInSe_2 Thin Films
- Dual Light Illumination Method in Scanning Tunneling Microscopy for Photoinduced Current Measurements on InAs Wires
- Photothermal Spectroscopic Measurements by Dual Sampling Method in Intermittent-Contact-Mode Atomic Force Microscopy
- Photothermal Signal and Surface Potential around Grain Boundaries in Multicrystalline Silicon Solar Cells Investigated by Scanning Probe Microscopy
- Intermittent Bias Application in Kelvin Probe Force Microscopy for Accurate Determination of Surface Potential
- Sample-and-Hold Operation in Kelvin Probe Force Microscopy
- Lateral Averaging Effects on Surface Potential Measurements on InAs Dots Studied by Kelvin Probe Force Microscopy
- Sample-and-Hold Imaging for Fast Scanning in Atomic Force Microscopy
- Surface Potential Imaging on InAs Low-Dimensional Nanostructures Studied by Kelvin Probe Force Microscopy
- Magnetic Field Observation around Current Path by Magnetic Force Microscopy
- Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy with Piezoresistive Cantilever
- Photovoltage Mapping on Polycrystalline Silicon Solar Cells through Potential Measurements by Atomic Force Microscopy with Piezoresistive Cantilever
- Dual-Bias Modulation Method for Scanning Tunneling Spectroscopy