Dual Light Illumination Method in Scanning Tunneling Microscopy for Photoinduced Current Measurements on InAs Wires
スポンサーリンク
概要
- 論文の詳細を見る
We propose a dual light illumination method in scanning tunneling microscopy (STM) for accurate characterization of photoabsorption properties of nanostructures on a substrate containing a depleted region and a consequent built-in field. In this method, both continuous and modulated lights are used to illuminate a sample surface. A change in STM current induced by the latter light is detected as a photoinduced current (PIC) signal, while the former light suppresses the effect of the built-in field near the sample surface. We have discussed the origins of PIC signals and examined the effectiveness of the dual light illumination method through direct observation of waveforms of PIC signals as well as lock-in detection of their amplitude and phase components on InAs wires formed on a vicinal GaAs substrate.
- 2009-08-25
著者
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Takahashi Takuji
Institute of Industrial Science and Institute for Nano Quantum Information Electronics, The University of Tokyo, Meguro, Tokyo 153-8505, Japan
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Takahashi Takuji
Institute of Industrial Science, University of Tokyo, Meguro, Tokyo 153-8505, Japan
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Katsui Shuichi
Institute of Industrial Science, University of Tokyo, Meguro, Tokyo 153-8505, Japan
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