Surface Potential Imaging on InAs Low-Dimensional Nanostructures Studied by Kelvin Probe Force Microscopy
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-07-30
著者
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Noda Takeshi
Institute Of Industrial Science University Of Tokyo
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Takahashi T
Department Of Electronic Engineering Kogakuin University
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ONO Shiano
Institute of Industrial Science, University of Tokyo
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TAKEUCHI Misaichi
Semiconductors Research Laboratory, RIKEN (The Institute of Physical and Chemical Research)
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TAKAHASHI Takuji
Institute of Industrial Science, University of Tokyo
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Takeuchi Misaichi
Semiconductors Research Laboratory Riken (the Institute Of Physical And Chemical Research)
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- Surface Potential Imaging on InAs Low-Dimensional Nanostructures Studied by Kelvin Probe Force Microscopy
- Direct Observation of Electron Jet from a Point Contact