Difference between Local and Average Structures of La3Ga5SiO14 Crystal
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概要
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The langasite (La3Ga5SiO14, LGS) crystal grown by the Czochralski technique was investigated by X-ray diffraction measurements. The X-ray diffraction profiles of the LGS consisted of sharp Bragg peaks and large amounts of diffuse scatterings. The diffuse scatterings indicated the existence of a local structure, which is different from the average structure of LGS. The local structure was analyzed by the pair-distribution function method. The local structure fluctuated owing to the local disordering of La atoms.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2007-10-30
著者
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Yoneda Yasuhiro
Synchrotron Radiation Research Center Japan Atomic Energy Research Institute
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Shiosaki Tadashi
Graduate School Of Materials Science Nara Institute Of Science And Technology
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Takeda Hiroaki
Graduate School of Material Science, Nara Institute of Science and Technology (NAIST), 8916-5 Takayama-cho, Ikoma, Nara 630-0192, Japan
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Yoneda Yasuhiro
Synchrotron Radiation Research Unit, Japan Atomic Energy Agency (JAEA), 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan
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Shiosaki Tadashi
Graduate School of Material Science, Nara Institute of Science and Technology (NAIST), 8916-5 Takayama-cho, Ikoma, Nara 630-0192, Japan
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