Analysis on the Behavior of a Low Voltage Triggered SCR ESD Clamp Circuit in Comparison between the Standard Transmission Line Pulse System and the Very Fast Transmission Line Pulse System
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概要
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We reported the characterization and the behavior of a Low Voltage Triggered SCR (LVTSCR) with vf-TLP (very-fast Transmission Line Pulse) measurements. The vf-TLP measured results showed that the triggering voltage (Vt1) decreased and the second breakdown current (It2) increased in the comparison with the standard 100ns TLP system. A series of experiments proved that it comes from the dV/dt effect and the power-to-failure versus pulse width relationship.
- 2009-06-17
著者
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KIM Dae-Woo
Device Engineering Team, Dongbu HiTek Co., Ltd.
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SONG Jong-Kyu
Device Engineering Team, Dongbu HiTek Co., Ltd.
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JANG Chang-Soo
Device Engineering Team, Dongbu HiTek Co., Ltd.
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JUNG Won-Young
Device Engineering Team, Dongbu HiTek Co., Ltd.
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Kim Dae‐woo
Device Engineering Team Dongbu Hitek Co. Ltd.
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Jung Won‐young
Device Engineering Team Dongbu Hitek Co. Ltd.
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Jung Won-young
Technical Engineering Center Dongbu Hitek
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Jung Won‐young
Soongsil Univ. Seoul Kor
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Park Jae‐young
Device Engineering Team Dongbu Hitek Co. Ltd.
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Park Jae-young
Div. Of Electrical And Computer Engineering Hanyang University
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Park Jae-young
Device Engineering Team Dongbu Hitek Co. Ltd.
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Kim Dae-woo
Device Engineering Team Dongbu Hitek Co. Ltd.
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Jang Chang-soo
Device Engineering Team Dongbu Hitek Co. Ltd.
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Song Jong-kyu
Device Engineering Team Dongbu Hitek Co. Ltd.
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Kim Taek‐soo
Dongbu Hitek Gyeonggi‐do Kor
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KIM Taek-Soo
Device Engineering Team, Technical Engineering Center
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