Jung Won-young | Technical Engineering Center Dongbu Hitek
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概要
関連著者
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Jung Won-young
Technical Engineering Center Dongbu Hitek
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Jung Won‐young
Device Engineering Team Dongbu Hitek Co. Ltd.
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Jung Won‐young
Soongsil Univ. Seoul Kor
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Park Jae-young
Device Engineering Team Dongbu Hitek Co. Ltd.
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Jang Chang-soo
Device Engineering Team Dongbu Hitek Co. Ltd.
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Song Jong-kyu
Device Engineering Team Dongbu Hitek Co. Ltd.
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JUNG Won-Young
Device Engineering Team, Dongbu HiTek Co., Ltd.
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Kim Dae‐woo
Device Engineering Team Dongbu Hitek Co. Ltd.
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Kim Jong-min
Technical Engineering Center Dongbu Hitek
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Park Jae‐young
Device Engineering Team Dongbu Hitek Co. Ltd.
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Park Jae-young
Div. Of Electrical And Computer Engineering Hanyang University
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Kim Taek-soo
Technical Engineering Center Dongbu Hitek
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KIM Dae-Woo
Device Engineering Team, Dongbu HiTek Co., Ltd.
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SONG Jong-Kyu
Device Engineering Team, Dongbu HiTek Co., Ltd.
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JANG Chang-Soo
Device Engineering Team, Dongbu HiTek Co., Ltd.
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JUNG Won-Young
Technical Engineering Center, Dongbu HiTek
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KIM Jin-Soo
Technical Engineering Center, Dongbu HiTek
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KIM Taek-Soo
Technical Engineering Center, Dongbu HiTek
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Kim Dae-woo
Device Engineering Team Dongbu Hitek Co. Ltd.
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Kim Jin-soo
Technical Center Daewoo Motor Co.
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Kim Taek‐soo
Dongbu Hitek Gyeonggi‐do Kor
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Jung Won-young
School Of Electronic Engineering Soongsil University:(present Office)r & D Nanno Solutions Inc.
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Wee Jae-kyung
School Of Electronic Engineering Soongsil University
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Jung Won-young
School Of Electronic Engineering Soongsil University
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KIM Taek-Soo
Device Engineering Team, Technical Engineering Center
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KIM Yong-Ju
Memory Research & Development Division, Hynix Semiconductor Inc.
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Kim Yong-ju
Memory R&d Center Hynix
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WEE Jae-Kyung
School of Electronic Engineering, Soongsil University
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KIM Yong-Ju
Memory R&D Center
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PARK Jae-Young
DE Team, TE Center, Dongbu HiTek
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SONG Jong-Kyu
DE Team, TE Center, Dongbu HiTek
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JANG Chang-Soo
DE Team, TE Center, Dongbu HiTek
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JUNG Won-Young
DE Team, TE Center, Dongbu HiTek
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KIM Taek-Soo
DE Team, TE Center, Dongbu HiTek
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PARK Jae-Young
Device Engineering Team, Dongbu HiTek Co., Ltd.
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SON Young-Sang
Device Engineering Team, Dongbu HiTek Co., Ltd.
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HA Jong-Chan
Device Engineering Team, Dongbu HiTek Co., Ltd.
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KIM Jong-Min
Technical Engineering Center, Dongbu HiTek
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LEE Jong-Sub
Technical Engineering Center, Dongbu HiTek
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LEE Eun-Jin
Technical Engineering Center, Dongbu HiTek
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PARK Ki-Jung
Technical Engineering Center, Dongbu HiTek
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KWAK Sang-Hun
Technical Engineering Center, Dongbu HiTek
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Son Young-sang
Device Engineering Team Dongbu Hitek Co. Ltd.
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Lee Eun-jin
Technical Engineering Center Dongbu Hitek
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Ha Jong-chan
Device Engineering Team Dongbu Hitek Co. Ltd.
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Park Ki-jung
Technical Engineering Center Dongbu Hitek
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Lee Jong-sub
Technical Engineering Center Dongbu Hitek
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Kwak Sang-hun
Technical Engineering Center Dongbu Hitek
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Park Jae-young
De Team Te Center
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Song Jong-kyu
De Team Te Center
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Jang Chang-soo
De Team Te Center
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Jung Won-young
De Team Te Center
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Kim Taek-soo
De Team Te Center
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KIM Dae-Woo
DE Team, TE Center, Dongbu HiTek
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KIM San-Hong
DE Team, TE Center, Dongbu HiTek, Dongbu HiTek
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Kim San-hong
De Team Te Center Dongbu Hitek Dongbu Hitek
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Ha Jong‐chan
Dongbu Hitek Co. Ltd. Gyeonggi‐do Kor
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Lim Ji-hoon
School Of Electronic Engineering Soongsil University
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Kim Dae-woo
De Team Te Center
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Kim San-hong
De Team Te Center Dongbu Hitek
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KIM Hyungon
Nanno Solutions, Inc.
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HA Jong-Chan
School of Electronic Engineering, Soongsil University
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Kim Hyungon
Nanno Solutions Inc.
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Ha Jong-chan
School Of Electronic Engineering Soongsil University
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Kim Jong-min
Device Technology Team Te Center Dongbu Hitek Co. Ltd.
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KIM Jin-Soo
Device Technology Team, TE Center, Dongbu HiTek Co., Ltd.
著作論文
- A Non-snapback NMOS ESD Clamp Circuit using Gate-Coupled Scheme with Isolated Well in a Bipolar-CMOS-DMOS Process(Session 7B : Si IC and Circuit Technology)
- A Precision Floating-Gate Mismatch Measurement Technique for Analog Application(Session 7B : Si IC and Circuit Technology)
- A Precision Floating-Gate Mismatch Measurement Technique for Analog Application(Session 7B : Si IC and Circuit Technology)
- A Physical-Based Modeling for Accurate Wide-Width LDMOS(Session 7B : Si IC and Circuit Technology)
- A Physical-Based Modeling for Accurate Wide-Width LDMOS(Session 7B : Si IC and Circuit Technology)
- A Non-snapback NMOS ESD Clamp Circuit using Gate-Coupled Scheme with Isolated Well in a Bipolar-CMOS-DMOS Process(Session 7B : Si IC and Circuit Technology)
- On-Chip Charged Device Model ESD Protection Design Method Using Very Fast Transmission Line Pulse System for RF ICs
- Analysis on the Behavior of a Low Voltage Triggered SCR ESD Clamp Circuit in Comparison between the Standard Transmission Line Pulse System and the Very Fast Transmission Line Pulse System
- Analysis on the Behavior of a Low Voltage Triggered SCR ESD Clamp Circuit in Comparison between the Standard Transmission Line Pulse System and the Very Fast Transmission Line Pulse System
- Novel Method of Interconnect Worstcase Establishment with Statistically-Based Approaches
- A Novel High-Speed and Low-Voltage CMOS Level-Up/Down Shifter Design for Multiple-Power and Multiple-Clock Domain Chips(Electronic Circuits)
- Fast and Accurate Power Bus Designer for Multi-Layers High-Speed Digital Boards(Integrated Electronics)
- A Latchup-Free ESD Power Clamp Circuit with Stacked-Bipolar Devices for High-Voltage Integrated Circuits
- A Precision Floating-Gate Mismatch Measurement Technique for Analog Application