JUNG Won-Young | Device Engineering Team, Dongbu HiTek Co., Ltd.

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著作論文

A non-snapback NMOS ESD clamp circuit using gate-coupled scheme with isolated well in a Bipolar-CMOS-DMOS process (Silicon devices and materials)
A Non-snapback NMOS ESD Clamp Circuit using Gate-Coupled Scheme with Isolated Well in a Bipolar-CMOS-DMOS Process(Session 7B : Si IC and Circuit Technology)
A Non-snapback NMOS ESD Clamp Circuit using Gate-Coupled Scheme with Isolated Well in a Bipolar-CMOS-DMOS Process(Session 7B : Si IC and Circuit Technology)
Analysis on the Behavior of a Low Voltage Triggered SCR ESD Clamp Circuit in Comparison between the Standard Transmission Line Pulse System and the Very Fast Transmission Line Pulse System
Analysis on the Behavior of a Low Voltage Triggered SCR ESD Clamp Circuit in Comparison between the Standard Transmission Line Pulse System and the Very Fast Transmission Line Pulse System
A Non-snapback ESD Protection Clamp Circuit Using Isolated Parasitic Capacitance in a 0.35μm Bipolar-CMOS-DMOS Process
A Precision Floating-Gate Mismatch Measurement Technique for Analog Application

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