JANG Chang-Soo | Device Engineering Team, Dongbu HiTek Co., Ltd.
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概要
関連著者
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KIM Dae-Woo
Device Engineering Team, Dongbu HiTek Co., Ltd.
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SONG Jong-Kyu
Device Engineering Team, Dongbu HiTek Co., Ltd.
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JANG Chang-Soo
Device Engineering Team, Dongbu HiTek Co., Ltd.
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JUNG Won-Young
Device Engineering Team, Dongbu HiTek Co., Ltd.
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Kim Dae‐woo
Device Engineering Team Dongbu Hitek Co. Ltd.
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Jung Won‐young
Device Engineering Team Dongbu Hitek Co. Ltd.
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Jung Won-young
Technical Engineering Center Dongbu Hitek
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Jung Won‐young
Soongsil Univ. Seoul Kor
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Park Jae-young
Device Engineering Team Dongbu Hitek Co. Ltd.
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Kim Dae-woo
Device Engineering Team Dongbu Hitek Co. Ltd.
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Jang Chang-soo
Device Engineering Team Dongbu Hitek Co. Ltd.
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Song Jong-kyu
Device Engineering Team Dongbu Hitek Co. Ltd.
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PARK Jae-Young
Device Engineering Team, Dongbu HiTek Co., Ltd.
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SON Young-Sang
Device Engineering Team, Dongbu HiTek Co., Ltd.
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HA Jong-Chan
Device Engineering Team, Dongbu HiTek Co., Ltd.
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Park Jae‐young
Device Engineering Team Dongbu Hitek Co. Ltd.
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Park Jae-young
Div. Of Electrical And Computer Engineering Hanyang University
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Son Young-sang
Device Engineering Team Dongbu Hitek Co. Ltd.
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Ha Jong-chan
Device Engineering Team Dongbu Hitek Co. Ltd.
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Kim Taek‐soo
Dongbu Hitek Gyeonggi‐do Kor
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KIM Taek-Soo
Device Engineering Team, Technical Engineering Center
著作論文
- A non-snapback NMOS ESD clamp circuit using gate-coupled scheme with isolated well in a Bipolar-CMOS-DMOS process (Silicon devices and materials)
- A Non-snapback NMOS ESD Clamp Circuit using Gate-Coupled Scheme with Isolated Well in a Bipolar-CMOS-DMOS Process(Session 7B : Si IC and Circuit Technology)
- A Non-snapback NMOS ESD Clamp Circuit using Gate-Coupled Scheme with Isolated Well in a Bipolar-CMOS-DMOS Process(Session 7B : Si IC and Circuit Technology)
- Analysis on the Behavior of a Low Voltage Triggered SCR ESD Clamp Circuit in Comparison between the Standard Transmission Line Pulse System and the Very Fast Transmission Line Pulse System
- Analysis on the Behavior of a Low Voltage Triggered SCR ESD Clamp Circuit in Comparison between the Standard Transmission Line Pulse System and the Very Fast Transmission Line Pulse System