KIM Taek-Soo | Technical Engineering Center, Dongbu HiTek

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著作論文

A precision floating-gate mismatch measurement technique for analog application (Silicon devices and materials)
A physical-based modeling for accurate wide-width LDMOS (Electron devices)
A Precision Floating-Gate Mismatch Measurement Technique for Analog Application(Session 7B : Si IC and Circuit Technology)
A Precision Floating-Gate Mismatch Measurement Technique for Analog Application(Session 7B : Si IC and Circuit Technology)
A Physical-Based Modeling for Accurate Wide-Width LDMOS(Session 7B : Si IC and Circuit Technology)
A Physical-Based Modeling for Accurate Wide-Width LDMOS(Session 7B : Si IC and Circuit Technology)

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