A precision floating-gate mismatch measurement technique for analog application (Silicon devices and materials)

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概要

• 論文の詳細を見る
• 2010-06-30

著者

• JUNG Won-Young

  Technical Engineering Center, Dongbu HiTek

• KIM Jong-Min

  Technical Engineering Center, Dongbu HiTek

• KIM Jin-Soo

  Technical Engineering Center, Dongbu HiTek

• KIM Taek-Soo

  Technical Engineering Center, Dongbu HiTek

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