A physical-based modeling for accurate wide-width LDMOS (Electron devices)

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概要

• 論文の詳細を見る
• 2010-06-30

著者

• JUNG Won-Young

  Technical Engineering Center, Dongbu HiTek

• KIM Jin-Soo

  Technical Engineering Center, Dongbu HiTek

• KIM Taek-Soo

  Technical Engineering Center, Dongbu HiTek

• LEE Jong-Sub

  Technical Engineering Center, Dongbu HiTek

• LEE Eun-Jin

  Technical Engineering Center, Dongbu HiTek

• PARK Ki-Jung

  Technical Engineering Center, Dongbu HiTek

• KWAK Sang-Hun

  Technical Engineering Center, Dongbu HiTek

関連論文

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• A Precision Floating-Gate Mismatch Measurement Technique for Analog Application(Session 7B : Si IC and Circuit Technology)
• A Physical-Based Modeling for Accurate Wide-Width LDMOS(Session 7B : Si IC and Circuit Technology)
• A Physical-Based Modeling for Accurate Wide-Width LDMOS(Session 7B : Si IC and Circuit Technology)
• E303 A STUDY ON THE IN-CYLINDER FLAME PROPAGATION CHARACTERISTICS IN S.I. ENGINES BY USING FLAME VISUALIZATION(SI engine performance)

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