Characterization of Silicon-on-Insulator Wafers by Photoluminescence Decay Lifetime Measurement

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Fine Structure Due to Donor-Acceptor Pair Luminescence in Compensated Si
Photoluminescence Due to Degenerate Electron-Hole System in Silicon-on-Insulator Wafers under Ultraviolet Light Excitation
Deep-Level Luminescence in Czochralski-Grown Silicon Crystals after Long-Term Annealing at 450℃
Photoquenching and Recovery Effects of EL2 Absorption in GaAs : Optical Properties of Condensed Matter
Above Band-Gap Excitation Process of the 0.6 eV Luminescence Band in GaAs
Characterization of HF-Treated Si Surfaces by Photoluminescence Spectroscopy
Characterization of Silicon-on-Insulator Wafers by Photoluminescence Decay Lifetime Measurement
Photoluminescence Mapping System Applicable to 300 mm Silicon-on-Insulator Wafers : Instrumentation, Measurement, and Fabrication Technology
Characterization of Interface in GaAs Epitaxial Wafer by Spatially Resolved Photoluminescence from Cleaved Face
Correlation between Photoluminescence Lifetime and Interface Trap Density in Silicon-on-Insulator Wafers
Photoluminescence Analysis of {311} Interstitial Defects in Wafers Synthesized by Separation by Implanted Oxygen : Structure and Mechanical and Thermal Properties of Condensed Matter
Mapping of Vanadium-Related Luminescence on SiC Wafer at Room Temperature
Spectral Shape Analysis of Photoluminescence Excitation in Semiconductors
Direct Observation of Growth Striations in a Liquid Encapusulated Czochralski GaP Crystal by Light Scattering Method
Photoluminescence of Si_Ge_x/Si Quantum Well Structures
Photoluminescence of Low-Energy B^+-Implanted Silicon under Ultraviolet Light Excitation
Photoluminescence of Low-Energy B± Implanted Silicon under Ultraviolet Light Excitation
Defect Analysis in Bonded and H^+ Split Silicon-on-Insulator Wafers by Photoluminescence Spectroscopy and Transmission Electron Microscopy
Characterization of Light Element Impurities in Ultrathin Silicon-on-Insulator Layers by Luminescence Activation Using Electron Irradiation
Characterization of Nonuniformity of 6H-SiC Wafers by Photoluminescence Mapping at Room Temperature
Photoluminescence Due to Degenerate Electron-Hole System in Silicon-on-Insulator Wafers under Ultraviolet Light Excitation
Nondestructive Analysis of Propagation of Stacking Faults in SiC Bulk Substrate and Epitaxial Layer by Photoluminescence Mapping
Photoluminescence Study of Radiation-Enhanced Dislocation Glide in 4H-SiC
Polarization of Photoluminescence from Partial Dislocations in 4H-SiC
Analysis of Intra-Grain Defects in Multicrystalline Silicon Wafers by Photoluminescence Mapping and Spectroscopy
Photoluminescence Analysis of Proton Irradiation Effects in Cu(In,Ga)Se2 Solar Cells
Photoluminescence Study of Radiation-Enhanced Dislocation Glide in 4H-SiC
Comparison of Silicon-on-Insulator Wafer Mappings between Photoluminescence Intensity and Microwave Photoconductivity Decay Lifetime
Photoluminescence Imaging of Multicrystalline Si Wafers during HF Etching
The Performance of the Lithium-Ion Secondary Cells under Micro-Gravity Conditions—In-Orbit Operation of the Interplanetary Spacecraft 'HAYABUSA'
Correlation between Photoluminescence Lifetime and Interface Trap Density in Silicon-on-Insulator Wafers
Oxygen Precipitates and Related Defects in SOI Substrate Fabricated by Wafer Bonding and H^+ Splitting

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