Fabrication of High-Resolution and High-Aspect-Ratio Patterns on a Stepped Substrate by Using Scanning Probe Lithography with a Multilayer-Resist System
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1999-04-30
著者
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HEIKE Seiji
Advanced Research Laboratory, Hitachi, Ltd.
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HASHIZUME Tomihiro
Advanced Research Laboratory, Hitachi, Ltd.
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Ishibashi M
Advanced Research Laboratory Hitachi Ltd.
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Ishibashi Masayoshi
Advanced Research Laboratory Hitachi Ltd.
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Kajiyama H
Hitachi Ltd. Saitama Jpn
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Kajiyama Hiroshi
Advanced Research Laboratory Hitachi Ltd.
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Kajiyama Hiroshi
Hitachi Research Laboratory Hitachi Ltd.
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Hashizume Tomihiro
Advanced Research Laboratory Hitachi Lid.
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Sugita Nami
Advanced Research Laboratory Hitachi Ltd.
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Heike S
Advanced Research Laboratory Hitachi Ltd.
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Heike Seiji
Advanced Research Laboratory Hitachi Ltd.
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Sugita Nami
Precision And Intelligence Laboratory Tokyo Institute Of Technology
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Hitosugi T.
Department Of Superconductivity University Of Tokyo:(present Address)department Of Chemistry Univers
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Heike S.
Advanced Research Laboratory Hitachi Ltd.
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Ishibashi M
Advanced Research Laboratory Hitachi Ltd. Hatoyama
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Heike S
Hitachi Ltd. Saitama Jpn
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Hashizume Tomihiro
Advanced Research Lab., Hitachi, Ltd., Hatoyama, Saitama 350-0395, Japan
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Heike Seiji
Advanced Research Lab., Hitachi, Ltd., Hatoyama, Saitama 350-0395, Japan
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