Heike Seiji | Advanced Research Lab., Hitachi, Ltd., Hatoyama, Saitama 350-0395, Japan

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概要

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著作論文

Fabrication Process of Fine Electrodes Using Shadow Mask Evaporation and Tip-Induced Local Oxidation
Nanofabrication Using Atomic Force Microscopy Lithography for Molecular Devices
Dot-Array Resist Patterning Using Scanning Probe Microscopy with a Hybrid Current-Voltage Control Method
Combining Atomic Force Microscopic Lithography with Photolithography
Fabrication of High-Resolution and High-Aspect-Ratio Patterns on a Stepped Substrate by Using Scanning Probe Lithography with a Multilayer-Resist System
Fabrication of High-Resolution and High-Aspect-Ratio Patterning on a Stepped Substrate by Scanning Probe Lithography Using a Multilayer-Resist System
Characteristics of Nanoscale Lithography Using AFM with a Current-Controlled Exposure System
Characteristics of Nanoscale Lithography Using Atomic Force Microscope with Current-Controlled Exposure System
Direct Imaging of Thermodynamic Process In Atom Migration by Using Scanning Tunneling Microscopy
Reduced Density of Missing-Dimer Vacancies on Tungsten-Contaminated Si (100)-(2×n) Surface by Hydrogen Termination
Control of Surface Current on a Si(111) Surface by Using Nanofabrication
Initial Stage of Molecular Adsorption on Si(100) and H-terminated Si(100) Investigated by UHV-STM(STM-Si(001))
Scanning Tunneling Spectroscopy of Dangling-Bond Wires Fabricated on the Si(100) -2 × 1 -H Surface
Property Change of Si(111) Surface by Scanning Tunneling Microscope Manipulation
Evaluation of Thin Silicon Dioxide Layers by Beam Assisted Scanning Tunneling Microscope
Pulse Injection of Carbon Nanotubes onto a H-terminated Si(100) Surface
Initial Backbond Oxidation at an Unpaired Dangling Bond Site on a Hydrogen-Terminated Si (100) 2×1 Surface
Electrical Conductivity Measurement of DNA Double-Stranded Chains by "One-by-One" Cutting Method Using Atomic Force Microscopy(Cross-disciplinary physics and related areas of science and technology)
Study of Initial Stage of Molecular Adsorption on Si(100) by Scanning Tunneling Microscopy
Growth Control of Nano-Needle on Silicon Surface Using Scanning Tunneling Microscope
Development of an In-Situ Method of Fabricating Artificial Atom Structures on the Si(100) Surface
Interaction of Ga Adsorbates with Dangling Bonds on the Hydrogen Terminated Si(100) Surface
In Situ Direct Imaging of Scanning Tunneling Microscope Tip Apex
In Situ Direct Imaging of Scanning Tunneling Microscope Tip Apex
Nanofabrication Using Atomic Force Microscopy Lithography Combined with Optical Lithography
Surface Potential Measurement by Atomic Force Microscopy Using Quartz Resonator
First Principles Study of Dihydride Chains on H-Terminated Si(100)-$2{\times}1$ Surface
Electrical Conduction of Ag Nanowire Fabricated on Hydrogen-Terminated Si(100) Surface
Scanning Tunneling Microscopy/Spectroscopy of La2@C72 Multilayer Islands on Si(100)-2$\times$1-H Surfaces
Fabrication of Four-Probe Fine Electrodes Using Scanning-Probe Nanofabrication
Electronic Structures of Individual Poly(3-hexylthiophene) Nanowires on Hydrogen-Terminated Si(100) Surfaces
Characteristics of Nanoscale Lithography Using AFM with a Current-Controlled Exposure System
Initial-Stage Dihydride Formation on Si(100)-$2{\times}1$-H Surface

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