Wada Y | Institute Of Industrial Science University Of Tokyo:core Research For Evolutional Science And Techno

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概要

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著作論文

Fabrication of Micromechanical Tunneling Probes and Actuators on a Silicon Chip
A Digital-to-Analog Converter of Displacement by an Integrated Micromechanism
Fabrication of Less Than a 10 nm Wide Polycrystalline Silicon Nano Wire
Characteristics of Nanoscale Lithography Using AFM with a Current-Controlled Exposure System
Characteristics of Nanoscale Lithography Using Atomic Force Microscope with Current-Controlled Exposure System
Control of Surface Current on a Si(111) Surface by Using Nanofabrication
Theoretical Study of Ga Adsorbates around Dangling-Bond Wires on am H-Terminated Si Surface: Possibility of Atomic-Scale Ferromagnets
Initial Stage of Molecular Adsorption on Si(100) and H-terminated Si(100) Investigated by UHV-STM(STM-Si(001))
Scanning Tunneling Spectroscopy of Dangling-Bond Wires Fabricated on the Si(100) -2 × 1 -H Surface
Property Change of Si(111) Surface by Scanning Tunneling Microscope Manipulation
Evaluation of Thin Silicon Dioxide Layers by Beam Assisted Scanning Tunneling Microscope
Observation of Threefold Symmetry Images due to a Point Defect on a Graphite Surface Using Scanning Tunneling Microscope (STM)
Submicron Channel MOSFET Using Focused Boron Ion Beam Implantation into Silicon
Study of Initial Stage of Molecular Adsorption on Si(100) by Scanning Tunneling Microscopy
Growth Control of Nano-Needle on Silicon Surface Using Scanning Tunneling Microscope
Development of an In-Situ Method of Fabricating Artificial Atom Structures on the Si(100) Surface
Interaction of Ga Adsorbates with Dangling Bonds on the Hydrogen Terminated Si(100) Surface
In Situ Direct Imaging of Scanning Tunneling Microscope Tip Apex
In Situ Direct Imaging of Scanning Tunneling Microscope Tip Apex

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