Observation of Threefold Symmetry Images due to a Point Defect on a Graphite Surface Using Scanning Tunneling Microscope (STM)
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1994-09-15
著者
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Kondo S
Dep. Electronic Engineering Sendai Jpn
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WADA Yasuo
Advanced Research Laboratory, Hitachi Ltd.
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KONDO Seiichi
Advanced Research Laboratory, Hitachi, Ltd.
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LUTWYCHE Mark
Advanced Research Laboratory, Hitachi Ltd.
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Lutwyche Mark
Advanced Research Laboratory Hitachi Ltd.
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Kondo S
Ntt Photonics Laboratories
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Wada Y
Institute Of Industrial Science University Of Tokyo:core Research For Evolutional Science And Techno
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Wada Yasuo
Central Research Laboratory Hitach Ltd.
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Wada Yasuo
Advanced Research Laboratory Hitachi Ltd.
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Kondo Seiichi
Advanced Research Laboratory Hitachi Ltd.
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