Tunneling Measurements on A15 Nb-Si Films
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1984-01-20
著者
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Maeda Y
Deparment Of Information And Control Engineering Toyota Technological Institute
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Maeda Y
Center For Microelectronic Systems Kyushu Institute Of Technology
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Maeda Y
The Institute Of Scientific And Industrial Research Osaka University
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NAKAMURA Kiko
Ibaraki Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation
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ASANO Hidefumi
Ibaraki Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation
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MAEDA Yasushi
Ibaraki Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation
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MICHIKAMI Osamu
Ibaraki Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation
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Nakamura Kiko
Ibaraki Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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Asano Hidefumi
Ibaraki Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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Michikami Osamu
Ibaraki Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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Maeda Yasushi
Ibaraki Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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