In Situ Observation of Pulsed Laser Doping : Semiconductors and Semiconductor Devices

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Characterization of ZnSe/GaAs(001) Heteroepitaxial Interfaces by X-Ray Reflectivity Measurement
Improvement of Gate-Insulator/Silicon Interface Characteristics in Amorphous Silicon Thin Film Transistors
Observation of Laser-Induced Melting of Silicon Film Followed by Amorphization
Pulsed Laser-Induced Amorphization of Polycrystalline Silicon Film
Measuring the Temperature of a Quartz Substrate during and after the Pulsed Laser-Induced Crystallization of a-Si:H
In Situ Observation of Pulsed Laser Doping : Semiconductors and Semiconductor Devices
Fabrication of Heavily-Doped Polycrystalline Silicon Film Using a Laser-Doping Technique
Crystalline Properties of Laser Crystallized Silicon Films
The Gas Combustion of H_2 with N_2O Used for Rapid Thermal Annealing
Application of Rapid Joule Heating Method to Fabrication of Polycrystalline Silicon Thin Film Transistors
Rapid Joule Heating of Metal Films Used to Fabricate Polycrystalline Silicon Thin Film Transistors : Semiconductors
Improvement in Characteristics of Polycrystalline Silicon Thin-Film Transistors by Heating with High-Pressure H_2O Vapor
Heat Theatment of Amorphous and Polycrystalline Silicon Thin Films with High-Pressure H_2O Vapor
Heat Treatment of Amorphous and Polycrystalline Silicon Thin Films with H_20 Vapor
Heat Treatment with High-Pressure H_2O Vapor of Pulsed Laser Crystallized Silicon Films
Electrical Properties of Excimer-Laser-Crystallized Lightly Doped Polycrystalline Silicon Films
Injection Luminescence in ZnTe Diodes
Control of the Size and Position of Silicon Nanowires Grown via the Vapor-Liquid-Solid Technique
High Performance Bottom Gate TFTs by Excimer Laser Crystallization and Post Hydrogernation
Near Infrared Absorption in P-Doped ZnTe Crystals
Near Infrared Absorption in Phosphorus Doped P-Type ZnTe
Suppression of the Phase Transition to C54 TiSi_2 due to Epitaxial Growth of C49 TiSi_2 on Si(001) Substrates in Silicidation Process
Grazing Incidence X-Ray Diffraction Study on Effect of Implanted BF^+_2 and Linewidth on Titanium Silicidation
Transmission Electron Microscopy Observation of CoSi_x Spikes in Si Substrates during Co-silicidation Process
Anomalous Variations in Conductivity of a-Si: H with Nitrogen Doping
Behavior of Fluorine Atoms in a-Si: F: H Alloy Investigated by Gas Evolution and Infrared Absorption
Photoluminescence Spectra of ZnTe with Anomalous Temperature Dependence
Analysis of Dopant Diffusion in Molten Silicon Induced by a Pulsed Excimer Laser
Si Quantum Dot Formation with Low-Pressure Chemical Vapor Deposition
Characterization of ZnSe/GaAs(001) Heteroepitaxial Interfaces by X-Ray Reflectivity Measurement
XeCl Excimer Laser Annealing Used to Fabricate Poly-Si TFT's

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