Refractive-Index Dispersion in Zn_<1-x>Cd_xTe Ternary Alloys
スポンサーリンク
概要
- 論文の詳細を見る
Refractive-index dispersion in Zn_<1-x>Cd_xTe ternary alloys has been measured at room temperature in the 1.1-2.5-eV photon-energy range using spectroscopic ellipsometry. The results are fitted to the first-order Sellmeier equation. The high-frequency dielectric constant, ε_∞, is also found to be not strongly dependent on the alloy composition x.
- 社団法人応用物理学会の論文
- 1993-09-15
著者
-
Kimura Toshifumi
Department Of Electornics Faculty Of Engineering Himeji Institute Of Technology
-
Adachi Sadao
Department Of Electronic Engineering Gunma University
関連論文
- Image Segmentation Using HIS Color Space and Considering Pixel Block Properties
- Moving Pictures Segmentation and Adaptive Motion Compensation
- Mesoscopic Phenomena in Microstructures of IV-VI Epilayers
- Direct Observation of Exciton Magnetic Polaron in CdMnTe from Polarized Magneto-Photoluminescence
- Optical Properties of CuO Studied by Spectroscopic Ellipsometry
- Optical Properties of Cu_2O Studied by Spectroscopic Ellipsometry
- Numerical Studies on Parameters for Stable Adiabatic Inversion by Gaussian and Square Pulses
- Measurement of Dipole Matrix Element of Atomic Gd Transitions using Rabi Flopping
- Chemical Treatmemt Effect of Si(111) Surfaces in H_2SO_4 : H_2O_2 Solution
- NH_4OH-Treated Si(111) Surfaces Studied by Spectroscopic Ellipsometry and Atomic Force Microscopy
- Quasi-Static Analysis of Resonant Brillouin Scattering in ZnSe, ZnTe and CdS
- Evaluation of Multilayer Structure and Depth Profile by PAS Using a Transparent Transducer : Photoacoustic Spectroscopy
- Evaluation of Ion Implantation into Silicon Photoacoustic Spectroscopy using Transparent Transducer Method : Photoacoustic Spectroscopy
- Decomposition of Chlorofluorocarbon by Pulse High-Current Discharge and Fast Burning through Spark Discharge
- Decomposition of Low-Pressure Pollutant by Repeated Pulse Microwave Discharge
- Application of Pulse High-Energy Electron Beams for Decomposition of Chlorofluorocarbon in Atmospheric-Pressure Air
- Optical Constants of ZnSe_xTe_ Ternary Alloys
- Optical Properties of Ion-Implanted Si layeres Studied by Spectroscopic Ellipsometry
- Numerical Study on Acoustic Emission from Flow Past an Airfoil
- Image Segmentation Using HIS Color Space and Considering Pixel Block Properties
- Motion Compensation and Shape Adaptive Coding of Moving Pictures by Cubic Curve Model
- Spectroscopic Ellipsometry Study of (111) and (100)Si Surfaces Etched in Aqueous KOH Solution
- Chemical Treatment Effectson Si (111) Surfaces in Aqueous NaF Solution : Semiconductors
- Effect of Lifetime Broadening on Resonant Brillouin Scattering in ZnTe and ZnSe
- Resonant Brillouin Scattering by LA Phonons in CdS
- Optical Constants of Amorphous Ga_2Te_3 and In_2Te_3
- Electroreflectance Study of (AlxGa1-x)0.5In0.5P Alloys
- HF-Treated (111), (110) and (100)Si Surfaces Studied by Spectroscopic Ellipsometry
- Spectroscopic Ellipsometry Study of Si Surfaces Modified by Low-Energy Ar^+-Ion Irradiation
- Refractive-Index Dispersion in Zn_Cd_xTe Ternary Alloys
- Optical Constants of Zn_Cd_xTe Ternary Alloys : Experiment and Modeling
- Optical Constants of Cubic ZnS
- Optical Constants of Amorphous Ga_2Se_3
- Optical Properties of SnTe
- Optical Properties of PbTe
- Chemical Etching Characteristics of (100)GaAs in Kusatsu Spa Water
- Numerical Derivative Analysis of the Pseudodielectric Function of CdTe
- Resonant Forbidden Brillouin Scattering in CdS
- Spectroscopic-Ellipsometry and Thermoreflectance Spectra of Sputter-Deposited InSb Films
- Optical Properties of (Al_xGa_)_In_P Quaternary Alloys
- Chemical Treatment Effects on Si Surfaces in SC2 Solutions Studied by Spectroscopic Ellipsometry
- Study of GaAs(001) Surfaces Treated in Aqueous HCl Solutions
- Porous Silicon Formation by Photoetching in HF/H2O2 Solution Using Incoherent Light Source
- Light Emission from Porous Silicon Photoetched in Aqueous Alkali Salt Solutions
- Analysis of Optical Constants for Sputter-Deposited InSb Films Based on the Interband-Transition Model
- Resonant Brillouin Scattering in Zn_xCd_Te Solid Solutions
- Resonant Brillouin Scattering in CdS by Piezoelectrically Inactive TA Phonon Domains
- Resonant Brillouin Scattering in ZnTe
- Resonant Brillouin Scattering in GaSe and GaS
- Optical Constants of In_Ga_xSb Ternary Alloys : Experiment and Modeling
- Photoreflectance Spectroscopy of ZnO for Ordinary and Extraordinary Rays
- Annealing Effect on Copper Impurity Emission in ZnSe
- Phosphorus-Ion-Implantation into ZnSe Single Crystals
- Chemical Treatment Effects of Si Surfaces in NH_4OH:H_2O_2:H_2O Solutions Studied by Spectroscopic Ellipsometry
- Optical Dispersion Relations in Amorphous Semiconductors: Model-Dielectric-Function Approach to Amorphous GaAs
- Energy Level Study of Phosphorus-Ion-Implanted ZnSe
- Optical Constants of ZnO
- Chemical Treatment Effect of Si(111) Surfaces in NH_4F Solution Studied by Spectroscopic Ellipsometry
- Chemical Etching of Thermally-Grown SiO_2 Films on SiC Studied by Spectroscopic Ellipsometry
- Optical Constants of 6H-SiC Single Crystals
- Anomalous Enhancement of Electron Paramagnetic Resonance Signal of Mn^ in N-Ion-Implanted CdS