SPIRIT:A High Robust Combinational Test Generation Algorithm (デザインガイヤ2000) -- (VLSIの設計/検証/テスト及び一般)
スポンサーリンク
概要
- 論文の詳細を見る
In this paper, we present an efficient and robust test generation algorithm for combinational circuits based on the Boolean satisfiability method called SPIRIT. We elaborate some well-known techniques as well as present some new techniques that improve performance and robustness of test generation algorithms. As a result, SPIRIT achieves 100% fault efficiency for full scan version of the ITC'99 benchmark circuits in a reasonable amount of time.
- 社団法人電子情報通信学会の論文
- 2000-11-23
著者
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FUJIWARA Hideo
Nara Institute of Science and Technology (NAIST)
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Gizdarski Emil
Department of Computer Systems, University of Rousse
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Fujiwara Hideo
Nara Institute Of Science And Technology Ikoma Nara
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Gizdarski Emil
Department Of Computer Systems University Of Rousse
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Fujiwara Hideo
Nara Inst. Of Sci. And Technol. (naist) Ikoma‐shi Jpn
関連論文
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- SPIRIT: A High Robust Combinational Test Generation Algorithm (デザインガイヤ2000) -- (VLSIの設計/検証/テスト及び一般)
- FOREWORD (Special Issue on Synthesis and Verification of Hardware Design)
- Optimal Granularity of Parallel Test Generation on the Client-Agent-Server Model
- SPIRIT:A High Robust Combinational Test Generation Algorithm (デザインガイヤ2000) -- (VLSIの設計/検証/テスト及び一般)
- SPIRIT:A High Robust Combinational Test Generation Algorithm (デザインガイヤ2000) -- (VLSIの設計/検証/テスト及び一般)
- Error Identification in At-Speed Scan BIST Environment in the Presence of Circuit and Tester Speed Mismatch(Dependable Computing)
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