Fault set partition for efficient width compression
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概要
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In this paper, we present a technique for reducing the test application time of the counter-based pseudo-exhaustive built-in self-testing(BIST). The proposed technique is based on the width compression method and the divide-and-conquer strategy. More formally, we divide the target fault set in k groups(subsets)and apply the width compression method in respect to each fault subset. By selecting k(the number of the groups of the fault set partition), this technique allows a trade-off between test application time and area overhead to be achieved. The synthesis procedure and an example for design of a self-testing test pattern generator using a configurable LFSR is presented. The experimental results show that in the critical cases the proposed technique achieves complete fault coverage of the stuck-at faults in much smaller test application time than the previously published counter-based exhaustive BIST techniques. We study different options to apply the proposed technique based on a test-per-clock(non-scan)BIST scheme. The resultant low-overthead BIST solutions allow at-speed testing and complete fault coverage of the single stuck-at faults to be achieved in reasonable test application time.
- 社団法人電子情報通信学会の論文
- 2001-02-02
著者
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Gizdarski Emil
Department Of Computer Systems University Of Rousse
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Fujiwara Hideo
Nara Inst. Of Sci. And Technol. (naist) Ikoma‐shi Jpn
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