Effects of Relativistic Frequency Down-Shift and Optical Thickness on Measurements of Electron Temperature Profile from Electron Cyclotron Emission in Medium Temperature Tokamak Plasmas
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概要
- 論文の詳細を見る
The inuportance of the tel;ttivistic ['n'equency down-shift and the optical thickness is pointedout in the detern'xination of the electron t,etaaperature profile frona electron cyclotron euaaission(ICE) raaeastrrenaent in the naedittrn electron teunperattrre region. These efl'ects c?ttrse a psetrdoradial displacement (,4r) of the obtained electron teraaperattrre profile. The psetrdo displacenaentdepends on only three paranaeters (the electron ternperattrr'e, T., the optical depth, r, and theraaajor raditrs, R). In order to correct the radial position in any tokazaaak, a scaling law of thedisplacettaent is derived as Ar (uaa) : 0.0009 R (m) T. (keV) (l -f- 40/(5r)). This scaling law isapplicable to the plasm;r with r >5 where the error is less than 0,5% of' the rna.jor r?tditus.
- 社団法人日本物理学会の論文
- 1998-09-15
著者
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SATO Masayasu
Japan Atomic Energy Research Institute, Division of Large Tokamak
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ISEI Nobuaki
Japan Atomic Energy Research Institute
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ISAYAMA Akihiko
Japan Atomic Energy Research Institute
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Sato Masayasu
Japan Atomic Energy Research Institute Division Of Large Tokamak
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Ishida Shuichi
Division Of Cardiovascular Medicine Department Of Internal Medicine Ohmori Hospital Toho University
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ISHIDA Shinichi
Japan Atomic Energy Research Institute
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Isei N
Japan Atomic Energy Research Institute
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Sato Masayasu
Japan Atomic Energy Research Institute
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Ishida S
Department Of Physics Faculty Of Science Kagoshima University
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ISAYAMA Akihiko
Japan Atomic Energy Agency
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