YASUTAKE Kiyoshi | Graduate School of Engineering, Osaka University
スポンサーリンク
概要
関連著者
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SHIMURA Takayoshi
Department of Material and Life Science, Graduate School of Engineering, Osaka University
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Watanabe Heiji
Department Of Material And Life Science Graduate School Of Engineering Osaka University
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Yasutake K
Graduate School Of Engineering Osaka University
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Shimura Takayoshi
Graduate School Of Engineering Osaka University
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Shimura Takayoshi
Department Of Material And Life Science Graduate School Of Engineering Osaka University
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YASUTAKE Kiyoshi
Graduate School of Engineering, Osaka University
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WATANABE Heiji
Graduate School of Engineering, Osaka University
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Yasutake Kiyoshi
Graduate School Of Engineering Osaka University
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Watanabe Heiji
Graduate School Of Engineering Osaka University
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SHIMURA Takayoshi
Graduate School of Engineering, Osaka University
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Nakajima Kaoru
Dep. Of Micro Engineering Kyoto Univ.
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YASUTAKE Kiyoshi
Department of Precision Engineering, Faculty of Engineering, Osaka University
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NARA Yasuo
Semiconductor Leading Edge Technologies, Inc.
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WATANABE Heiji
Department of Precision Science and Technology, Osaka University
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YAMADA Keisaku
Nanotechnology Research Laboratories, Waseda University
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Nara Yasuo
Semiconductor Leading Edge Technologies Inc. (selete)
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Yasutake Kiyoshi
Department Of Material And Life Science Graduate School Of Engineering Osaka University
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IWAMOTO Hayato
Semiconductor Technology Development Division, Semiconductor Business Group, Sony Corporation
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KADOMURA Shingo
Semiconductor Technology Development Division, Semiconductor Business Group, Sony Corporation
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YAMADA Keisaku
Waseda Univ.
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AKASAKA Yasushi
Semiconductor Leading Edge Technologies Inc.
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Hosoi Takuji
Department Of Material And Life Science Graduate School Of Engineering Osaka University
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NAKAMURA Kunio
Semiconductor Leading Edge Technologies, Inc. (Selete)
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YOSHIDA Shiniti
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University
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WATANABE Yasumasa
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University
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Yamamoto K
Kaneka Corporation
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Kadomura Shingo
Semiconductor Technology Development Division Semiconductor Business Group Sony Corporation
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Iwamoto Hayato
Semiconductor Technology Development Division Semiconductor Business Group Sony Corporation
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IKUTA Tetsuya
Semiconductor Technology Development Division, Semiconductor Business Group, Sony Corporation
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MIYANAMI Yuki
Semiconductor Technology Development Division, Semiconductor Business Group, Sony Corporation
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FUJITA Shigeru
Semiconductor Technology Development Division, Semiconductor Business Group, Sony Corporation
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Miyanami Yuki
Semiconductor Technology Development Division Semiconductor Business Group Sony Corporation
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Yamada Keisaku
Graduate School Of Pure And Applied Sciences University Of Tsukuba
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KUTSUKI Katsuhiro
Graduate School of Engineering, Osaka University
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OKAMOTO Gaku
Graduate School of Engineering, Osaka University
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HOSOI Takuji
Graduate School of Engineering, Osaka University
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Nakamura Kunio
Semiconductor Leading Edge Technologies Inc. (selete)
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Watanabe Yasumasa
Department Of Chemical Pharmacology Faculty Of Pharmaceutical Sciences The University Of Tokyo
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Nara Yasuo
Semiconductor Leading Edge Technologies Inc.
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Okamoto Gaku
Graduate School Of Engineering Osaka University
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Yamada Keisaku
Nanotechnology Research Laboratories Waseda University
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Kutsuki Katsuhiro
Graduate School Of Engineering Osaka University
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Yoshida Shiniti
Department Of Precision Science And Technology Graduate School Of Engineering Osaka University
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Ikuta Tetsuya
Semiconductor Technology Development Division Semiconductor Business Group Sony Corporation
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Fujita Shigeru
Semiconductor Technology Development Division Semiconductor Business Group Sony Corporation
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Watanabe Yasumasa
Department Of Precision Science And Technology Graduate School Of Engineering Osaka University
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Nakamura Kunio
Semiconductor Leading Edge Technologies Inc.
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AKASAKA Yasushi
Semiconductor Leading Edge Technologies, Inc.
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WATANABE Yasumasa
Department of Aeronautics and Astronautics, The University of Tokyo
著作論文
- Thermal Degradation of HfSiON Dielectrics Caused by TiN Gate Electrodes and Its Impact on Electrical Properties
- In-situ Doped Si Selective Epitaxial Growth for Raised Source/Drain Extension CMOSFET
- Characteristics of Pure Ge_3N_4 Dielectric Layers Formed by High-Density Plasma Nitridation