NAKAMURA Kunio | Semiconductor Leading Edge Technologies, Inc. (Selete)
スポンサーリンク
概要
関連著者
-
Nakajima Kaoru
Dep. Of Micro Engineering Kyoto Univ.
-
NARA Yasuo
Semiconductor Leading Edge Technologies, Inc.
-
AKASAKA Yasushi
Semiconductor Leading Edge Technologies Inc.
-
NAKAMURA Kunio
Semiconductor Leading Edge Technologies, Inc. (Selete)
-
Yamamoto K
Kaneka Corporation
-
Shiraishi Kenji
Graduate School of Pure and Applied Science, University of Tsukuba
-
Umezawa Naoto
National Inst. For Materials Sci. Ibaraki Jpn
-
YASUTAKE Kiyoshi
Department of Precision Engineering, Faculty of Engineering, Osaka University
-
WATANABE Heiji
Graduate School of Engineering, Osaka University
-
WATANABE Heiji
Department of Precision Science and Technology, Osaka University
-
YAMADA Keisaku
Nanotechnology Research Laboratories, Waseda University
-
Nara Yasuo
Semiconductor Leading Edge Technologies Inc. (selete)
-
Yasutake Kiyoshi
Department Of Material And Life Science Graduate School Of Engineering Osaka University
-
SHIMURA Takayoshi
Department of Material and Life Science, Graduate School of Engineering, Osaka University
-
YAMADA Keisaku
Waseda Univ.
-
OOTSUKA Fumio
Semiconductor Leading Edge Technologies Inc.
-
NAKAMURA Genji
Semiconductor Leading Edge Technologies, Inc. (Selete)
-
UMEZAWA Naoto
Advanced Electronic Materials Center, National Institute for Materials Science
-
YAMABE Kikuo
Graduate School of Pure and Applied Sciences, University of Tsukuba
-
OGAWA Osamu
Semiconductor Leading Edge Technologies, Inc. (Selete)
-
LEE Myoungbum
Semiconductor Leading Edge Technologies, Inc. (Selete)
-
AMIAKA Toshio
Semiconductor Leading Edge Technologies, Inc. (Selete)
-
KASUYA Tooru
Semiconductor Leading Edge Technologies, Inc. (Selete)
-
CHIKYOW Toyohiro
Advanced Electronic Materials Center, National Institute for Materials Science
-
YOSHIDA Shiniti
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University
-
WATANABE Yasumasa
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University
-
Kasuya Tooru
Semiconductor Leading Edge Technologies Inc. (selete)
-
Arikado Tsunetoshi
Semiconductor Leading Edge Technologies Inc. (selete)
-
Lee Myoungbum
Semiconductor Leading Edge Technologies Inc. (selete)
-
Nakamura Genji
Semiconductor Leading Edge Technologies Inc. (selete)
-
Watanabe Heiji
Department Of Material And Life Science Graduate School Of Engineering Osaka University
-
Yamada Keisaku
Graduate School Of Pure And Applied Sciences University Of Tsukuba
-
Yasutake K
Graduate School Of Engineering Osaka University
-
Nakamura Kunio
Semiconductor Leading Edge Technologies Inc. (selete)
-
Watanabe Yasumasa
Department Of Chemical Pharmacology Faculty Of Pharmaceutical Sciences The University Of Tokyo
-
Nara Yasuo
Semiconductor Leading Edge Technologies Inc.
-
Yamada Keisaku
Nanotechnology Research Laboratories Waseda University
-
Yoshida Shiniti
Department Of Precision Science And Technology Graduate School Of Engineering Osaka University
-
Shimura Takayoshi
Graduate School Of Engineering Osaka University
-
Shimura Takayoshi
Department Of Material And Life Science Graduate School Of Engineering Osaka University
-
Watanabe Yasumasa
Department Of Precision Science And Technology Graduate School Of Engineering Osaka University
-
Nakamura Kunio
Semiconductor Leading Edge Technologies Inc.
-
AKASAKA Yasushi
Semiconductor Leading Edge Technologies, Inc.
-
YASUTAKE Kiyoshi
Graduate School of Engineering, Osaka University
-
WATANABE Yasumasa
Department of Aeronautics and Astronautics, The University of Tokyo
著作論文
- Modified Oxygen Vacancy Induced Fermi Level Pinning Model Extendable to P-Metal Pinning
- Thermal Degradation of HfSiON Dielectrics Caused by TiN Gate Electrodes and Its Impact on Electrical Properties