BERSUKER Gennadi | SEMATECH

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概要

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著作論文

Ultra-Short Pulse Current-Voltage Characterization of the Intrinsic Characteristics of High-κ Devices
Ultra-Short Pulse I-V Characterization of the Intrinsic Behavior of High-κ Devices
NBTI Dependence on Dielectric Thickness in Ultra-scaled HfSiO Dielectric/ALD-TiN Gate Stacks
Trapping/De-Trapping Gate Bias Dependence of Hf-Silicate Dielectrics with Poly and TiN Gate Electrode
Temperature Effects of Constant Bias Stress on n-Channel FETs with Hf-based Gate Dielectric
Transient charging and relaxation in high-k gate dielectrics and its implications
Trapping/de-trapping gate bias dependence of Hf-silicate dielectrics with poly and TiN gate electrode
Temperature effects of constant bias stress on NFETs with Hf-based gate dielectric
Charge Trapping Characteristics of Hafnium Based High-κ Dielectrics with Various Metal Electrodes
Stress-Polarity-Independent Negative Threshold Voltage Shift in HfO2/TiN P-Channel Metal Oxide Semiconductor Field-Effect Transistor
Negative Bias Temperature Instability Dependence on Dielectric Thickness and Nitrogen Concentration in Ultra-scaled HfSiON Dielectric/TiN Gate Stacks
Temperature Effects of Constant Bias Stress on n-Channel FETs with Hf-based Gate Dielectric

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