Trapping/de-trapping gate bias dependence of Hf-silicate dielectrics with poly and TiN gate electrode

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2004-09-15

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Trapping/De-Trapping Gate Bias Dependence of Hf-Silicate Dielectrics with Poly and TiN Gate Electrode
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Trapping/de-trapping gate bias dependence of Hf-silicate dielectrics with poly and TiN gate electrode
Temperature effects of constant bias stress on NFETs with Hf-based gate dielectric
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Charge Trapping Characteristics of Hafnium Based High-κ Dielectrics with Various Metal Electrodes
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Temperature Effects of Constant Bias Stress on n-Channel FETs with Hf-based Gate Dielectric
Transient Charging and Relaxation in High-k Gate Dielectrics and Their Implications

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