ZEITZOFF Peter | SEMATECH
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概要
関連著者
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Sim Jang
International Sematech
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Lee Byoung
Sematech Tx Usa
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LEE Byoung
IBM Assignee
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YOUNG Chadwin
SEMATECH
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BERSUKER Gennadi
SEMATECH
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ZEITZOFF Peter
SEMATECH
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Lee Byoung
Ibm
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Young Chadwin
International Sematech (ismt)
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Kwong Dim-lee
Microelectronic Research Center The University Of Texas At Austin
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CHOI Rino
SEMATECH
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SIM Jang
SEMATECH
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YOUNG Chadwin
International SEMATECH
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CHOI Rino
International SEMATECH
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BERSUKER Gennadi
International SEMATECH
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ZEITZOFF Peter
International SEMATECH
著作論文
- Trapping/De-Trapping Gate Bias Dependence of Hf-Silicate Dielectrics with Poly and TiN Gate Electrode
- Trapping/de-trapping gate bias dependence of Hf-silicate dielectrics with poly and TiN gate electrode