Kwong Dim-lee | Microelectronic Research Center The University Of Texas At Austin

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概要

• 同名の論文著者
• Microelectronic Research Center The University Of Texas At Austinの論文著者

関連著者

• Kwong Dim-lee

  Microelectronic Research Center The University Of Texas At Austin

• Sim Jang

  International Sematech

• Lee Byoung

  Sematech Tx Usa

• Kwong D‐l

  Univ. Texas At Austin Tx Usa

• CHANG Ruey-Dar

  Department of Electronic Engineering, Chang Gung University

• CHOI Rino

  SEMATECH

• LEE Byoung

  IBM Assignee

• YOUNG Chadwin

  SEMATECH

• SIM Jang

  SEMATECH

• BERSUKER Gennadi

  SEMATECH

• ZEITZOFF Peter

  SEMATECH

• Lee Byoung

  Ibm

• CHU Paul

  Department of Physics and Materials Science, City University of Hong Kong

• Chu Paul

  Department Of Physics And Materials Science City University Of Hong Kong

• Young Chadwin

  International Sematech (ismt)

• Chang Ruey-dar

  Department Of Electronic Engineering Chang Gung University

• CHOI Philip

  Microelectronics Research Center, University of Texas at Austin

• GARDNER Mark

  Advanced Micro Devices

• Choi Philip

  Microelectronics Research Center University Of Texas At Austin

• Lee Sungjoo

  Silicon Nano Device Lab Department Of Electrical And Computer Engineering National University Of Sin

• Kwong Dim-Lee

  Microelectronics Research Center, Department of Electrical and Computer Engineering,

• Kwong Dim-Lee

  Microelectronics Research Center, R9950, The University of Texas at Austin, Austin, TX 78758, USA

• Ahn Jinho

  Department of Materials Engineering, Graduate School of Advanced Materials and Chemical Engineering,

• Ahn Jinho

  Department of Material Science and Engineering, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Korea

• AHN Jinho

  Department of Computer Science, Kyonggi University

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著作論文

• Trapping/De-Trapping Gate Bias Dependence of Hf-Silicate Dielectrics with Poly and TiN Gate Electrode
• Time Dependence of Phosphorus Diffusion and Dose Loss during Postimplantation Annealing at Low Temperatures
• Reliability Characteristics of poly Si-gated High Quality Chemical Vapor Deposition Hafnium Oxide Gate Dielectric
• Device Performance and Reliability of P-Channel Metal-Oxide-Semiconductor Field Effect Transistors with Chemical-Vapor-Deposited Gate Oxides

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