CHOI Rino | International SEMATECH
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概要
関連著者
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Sim Jang
International Sematech
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YOUNG Chadwin
International SEMATECH
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CHOI Rino
International SEMATECH
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BERSUKER Gennadi
International SEMATECH
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Lee Byoung
Sematech Tx Usa
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YOUNG Chadwin
SEMATECH
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BERSUKER Gennadi
SEMATECH
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Lee Byoung
Ibm
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Young Chadwin
International Sematech (ismt)
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LEE Byoung
IBM Assignee
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LEE Byoung
International SEMATECH
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Brown George
International Sematech (ismt)
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Matthews Kenneth
International Sematech
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ZHAO Yuegang
Keithley Instruments
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PENDLEY Michael
SEMATECH
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PENDLEY Michael
International SEMATECH
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ZEITZOFF Peter
SEMATECH
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ZEITZOFF Peter
International SEMATECH
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Lee Byoung
International SEMATECH, 2706 Montopolis Drive, Austin, Texas 78741, U.S.A.
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Bersuker Gennadi
International SEMATECH, 2706 Montopolis Drive, Austin, Texas 78741, U.S.A.
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Young Chadwin
International SEMATECH, 2706 Montopolis Drive, Austin, Texas 78741, U.S.A.
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Choi Rino
International SEMATECH, 2706 Montopolis Drive, Austin, Texas 78741, U.S.A.
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Sim Jang
International SEMATECH, 2706 Montopolis Drive, Austin, Texas 78741, U.S.A.
著作論文
- Ultra-Short Pulse I-V Characterization of the Intrinsic Behavior of High-κ Devices
- Transient Charging and Relaxation in High-k Gate Dielectrics and Their Implications
- Transient charging and relaxation in high-k gate dielectrics and its implications
- Trapping/de-trapping gate bias dependence of Hf-silicate dielectrics with poly and TiN gate electrode
- Temperature effects of constant bias stress on NFETs with Hf-based gate dielectric
- Transient Charging and Relaxation in High-k Gate Dielectrics and Their Implications