Lee Byoung | SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.

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概要

• Lee Byoung Hunの詳細を見る
• 同名の論文著者
• SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.の論文著者

関連著者

• CHOI Rino

  SEMATECH

• BERSUKER Gennadi

  SEMATECH

• KRISHNAN Siddarth

  SEMATECH

• Lee Jack

  The University Of Texas At Austin Department Of Electrical And Computer Engineering

• Lee Byoung

  Sematech

• Harris Rusty

  Sematech

• KIRSCH Paul

  SEMATECH

• Harris Rusty

  SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.

• Quevedo Manuel

  SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.

• Krishnan Siddarth

  SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.

• Kirsch Paul

  SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.

• Lee Byoung

  SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.

• Bersuker Gennadi

  SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.

• Choi Rino

  SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.

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著作論文

• Negative Bias Temperature Instability Dependence on Dielectric Thickness and Nitrogen Concentration in Ultra-scaled HfSiON Dielectric/TiN Gate Stacks

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