KRISHNAN Siddarth | SEMATECH
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概要
関連著者
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CHOI Rino
SEMATECH
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BERSUKER Gennadi
SEMATECH
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KRISHNAN Siddarth
SEMATECH
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Lee Byoung
Sematech Tx Usa
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Kirsch Paul
Ibm
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LEE Byoung
IBM Assignee
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YOUNG Chadwin
SEMATECH
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QUEVEDO Manuel
TI
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HARRIS Rusty
AMD
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PETERSON Jeff
SEMATECH
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LI Hong-Jyh
Infineon
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LEE Jack
Electrical Engg. The University of Texas at Austin
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Lee Byoung
Ibm
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Lee Jack
The University Of Texas At Austin Department Of Electrical And Computer Engineering
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Lee Byoung
Sematech
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Harris Rusty
Sematech
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Young Chadwin
International Sematech (ismt)
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KIRSCH Paul
SEMATECH
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Harris Rusty
SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.
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Quevedo Manuel
SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.
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Krishnan Siddarth
SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.
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Kirsch Paul
SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.
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Lee Byoung
SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.
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Bersuker Gennadi
SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.
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Choi Rino
SEMATECH, 2706 Montopolis Dr, Austin, TX 78751, U.S.A.
著作論文
- NBTI Dependence on Dielectric Thickness in Ultra-scaled HfSiO Dielectric/ALD-TiN Gate Stacks
- Negative Bias Temperature Instability Dependence on Dielectric Thickness and Nitrogen Concentration in Ultra-scaled HfSiON Dielectric/TiN Gate Stacks