Nii Koji | Renesas Electronics Corporation
スポンサーリンク
概要
関連著者
-
Nii Koji
Renesas Electronics Corporation
-
Nii Koji
Renesas Technology Corporation
-
Takata Hidehiro
Renesas Electronics Corporation
-
Nii K
Renesas Technol. Corp. Itami‐shi Jpn
-
Makino Hiroshi
Renesas Technology Corporation
-
SHINOHARA Hirofumi
Renesas Technology Corporation
-
Makino H
Mitsubishi Electric Corp. Itami‐shi Jpn
-
Noguchi Hiroki
Graduate School of Engineering, Kobe University
-
Iguchi Yusuke
Graduate School of Engineering, Kobe University
-
Fujiwara Hidehiro
Graduate School of Engineering, Kobe University
-
Okumura Shunsuke
Graduate School of Engineering, Kobe University
-
Kawaguchi Hiroshi
Graduate School of Engineering, Kobe University
-
Yoshimoto Masahiko
Graduate School of Engineering, Kobe University
-
Kawaguchi Hiroshi
Kobe Univ. Kobe‐shi Jpn
-
OKUMURA Shunsuke
Kobe University
-
Ohbayashi Shigeki
Renesas Technology Corporation
-
Takata Hidehiro
Renesas Technol. Corp. Itami‐shi Jpn
-
Nagata Makoto
Graduate School Of System Informatics Kobe University
-
YOSHIMOTO Shusuke
Kobe University
-
Nagata Makoto
the Department of Geriatrics, Tokyo Womens Medical University
-
Yoshida K
Renesas Technol. Corp. Itami‐shi Jpn
-
Onodera Hidetoshi
Graduate School Of Informatics Kyoto University
-
NAKASE Yasunobu
Renesas Technology
-
IWADE Shuhei
Osaka Institute of Technology
-
Nakase Yasunobu
The System Lsi Laboratory Mitsubishi Electric Corporation
-
Yoshida Kanako
Renesas Technology Corporation
-
SHIMIZU Toru
Renesas Technology Corp.
-
Arakawa Masashi
Renesas Technology Corporation
-
TAKATA Hidehiro
Renesas Technology
-
NUNOMURA Yasuhiro
Renesas Technology
-
ITOH Niichi
Renesas Technology
-
ARAKAWA Takahiko
Renesas Technology
-
Uchida Takahiro
Renesas Technology Corporation
-
Ipposhi Takashi
Renesas Technology Corp.
-
Ipposhi Takashi
Renesas Technology Corporation
-
Tomita Kazuo
Renesas Technology Corporation
-
Tanaka Tomohiro
Renesas Technology Corporation
-
Imaoka Susumu
Renesas Design Corporation
-
Yabuuchi Makoto
Renesas Technology Corporation
-
Kono Kazushi
Renesas Technology Corporation
-
Oda Yuji
Shikino High-Tech Corporation
-
Usui Keiichi
Daioh Electric Co. Ltd.
-
Yonezu Toshiaki
Renesas Technology Corporation
-
Iwamoto Takeshi
Renesas Technology Corporation
-
Tsukamoto Yasumasa
Renesas Technology Corporation
-
Ishibashi Koichiro
Renesas Technology Corporation
-
SATO Hisakazu
Renesas Technology Corporation
-
ITO Hironobu
Renesas Technology Corporation
-
NAKANISHI Jingo
Renesas Technology Corporation
-
YAMADA Akira
Renesas Technology Corporation
-
HIRANO Yuichi
Renesas Technology Corporation
-
FUJII Masako
Renesas Technology Corporation
-
IGARASHI Motoshige
Renesas Technology Corporation
-
KAWAMURA Takeshi
Renesas Technology Corporation
-
YOKOTA Miho
Renesas Technology Corporation
-
TSUDA Nobuhiro
Renesas Technology Corporation
-
YOSHIZAWA Tomoaki
Renesas Technology Corporation
-
TSUTSUI Toshikazu
Renesas Technology Corporation
-
TAKESHITA Naohiko
Renesas Technology Corporation
-
MURATA Naofumi
Renesas Technology Corporation
-
FUJIWARA Takanari
Renesas Design Corporation
-
ASAHINA Kyoko
Renesas Technology Corporation
-
OKADA Masakazu
Renesas Technology Corporation
-
TAKEUCHI Masahiko
Renesas Technology Corporation
-
YAMAMOTO Shigehisa
Renesas Technology Corporation
-
SUGIMOTO Hiromitsu
Renesas Technology Corporation
-
Itoh N
Semiconductor Company Toshiba Corporationthe Authors Are With Semiconductor Company Toshiba Corporat
-
Takata H
Renesas Technology
-
Yamada A
Wireless Laboratories Ntt Docomo Inc.
-
Yoshizawa Tomoaki
Renesas Technol. Corp. Itami‐shi Jpn
-
Ishibashi Koichiro
Renesas Technology
-
Kawamura Takeshi
Kitami Inst. Of Technol. Kitami‐shi Jpn
-
Kawamura Takeshi
The Department Of Electrical And Electronic Engineering Kitami Institute Of Technology
-
Shimizu Toru
Renesas Technology Corporation
-
Shimizu Toru
Renesas Electronics Corporation
-
Shimizu Toru
Renesas Electronics Corp.
-
YOSHIMOTO Masahiko
JST, CREST
-
Nagata Makoto
The Department Of Information Science Graduate School Of System Informatics Kobe University
-
Sawada Takuya
The Department Of Information Science Graduate School Of System Informatics Kobe University
-
TOSHIKAWA Taku
the Department of Information Science, Graduate School of System Informatics, Kobe University
-
YOSHIKAWA Kumpei
the Department of Information Science, Graduate School of System Informatics, Kobe University
-
Toshikawa Taku
The Department Of Information Science Graduate School Of System Informatics Kobe University
-
Yoshikawa Kumpei
The Department Of Information Science Graduate School Of System Informatics Kobe University
-
Iguchi Yusuke
Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
-
Sawada Takuya
Graduate School of System Informatics, Kobe University, Kobe 657-8501, Japan
-
AMASHITA Takuro
Kobe University
-
ONODERA Hidetoshi
Graduate School of Informatics, Kyoto University
-
YOSHIMOTO Masahiko
JST CREST
-
Nagata Makoto
the Department of Geriatrics, Tokyo Women's Medical University
-
SAWADA Takuya
Graduate School of Engineering, University of Hyogo
-
NAKASE Yasunobu
Renesas Electronics Corp.
著作論文
- Design Choice in 45-nm Dual-Port SRAM — 8T, 10T Single End, and 10T Differential
- 招待講演 A 65nm embedded SRAM with wafer level burn-in mode, leak-bit redundancy and E-trim fuse for known good die (集積回路)
- Analytical Model of Static Noise Margin in CMOS SRAM for Variation Consideration
- A Low-Power Microcontroller with Body-Tied SOI Technology(Low-Power System LSI, IP and Related Technologies)
- A Large-Scale, Flip-Flop RAM Imitating a Logic LSI for Fast Development of Process Technology
- Design Choice in 45-nm Dual-Port SRAM — 8T, 10T Single End, and 10T Differential
- Evaluation of SRAM-Core Susceptibility against Power Supply Voltage Variation
- False Operation of Static Random Access Memory Cells under Alternating Current Power Supply Voltage Variation
- Multiple-Cell-Upset Tolerant 6T SRAM Using NMOS-Centered Cell Layout
- Bit-Error and Soft-Error Resilient 7T/14T SRAM with 150-nm FD-SOI Process
- False Operation of Static Random Access Memory Cells under Alternating Current Power Supply Voltage Variation (Special Issue : Solid State Devices and Materials)