Tsukamoto Yasumasa | Renesas Technology Corporation
スポンサーリンク
概要
関連著者
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Nii Koji
Renesas Technology Corporation
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Nii K
Renesas Technol. Corp. Itami‐shi Jpn
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Makino Hiroshi
Renesas Technology Corporation
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Makino H
Mitsubishi Electric Corp. Itami‐shi Jpn
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Tsukamoto Yasumasa
Renesas Technology Corporation
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NII Koji
System LSI Development Center, Mitsubishi Electric Corporation
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INOUE Yasuo
ULSI Development Center, Mitsubishi Electric Corporation
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Nii Koji
Renesas Electronics Corporation
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MAKINO Hiroshi
System LSI Development Center, Mitsubishi Electric Corporation
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IWADE Shuhei
Osaka Institute of Technology
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SHINOHARA Hirofumi
Renesas Technology Corporation
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Arakawa Masashi
Renesas Technology Corporation
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Uchida Takahiro
Renesas Technology Corporation
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KUNIKIYO Tatsuya
ULSI Research and Development Center, Mitsubishi Electric Corporation
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ISHIKAWA Kiyoshi
ULSI Research and Development Center, Mitsubishi Electric Corporation
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Imaoka Susumu
Renesas Design Corporation
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Ohbayashi Shigeki
Renesas Technology Corporation
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Yabuuchi Makoto
Renesas Technology Corporation
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Kono Kazushi
Renesas Technology Corporation
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Oda Yuji
Shikino High-Tech Corporation
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Usui Keiichi
Daioh Electric Co. Ltd.
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Yonezu Toshiaki
Renesas Technology Corporation
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Iwamoto Takeshi
Renesas Technology Corporation
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Ishibashi Koichiro
Renesas Technology Corporation
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TSUKAMOTO Yasumasa
System LSI Development Center,Mitsubishi Electric Corporation
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IWADE Shuhei
System LSI Development Center,Mitsubishi Electric Corporation
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KOTANI Norihiko
Hiroshima International University
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Ishikawa Kiyoshi
Ulsi Development Center Mitsubishi Electric Corporation
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Kunikiyo Tatsuya
Ulsi Development Center Mitsubishi Electric Corporation
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Ishibashi Koichiro
Renesas Technology
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Inoue Yasuo
Ulsi Development Center Mitsubishi Electric Corporation
著作論文
- 招待講演 A 65nm embedded SRAM with wafer level burn-in mode, leak-bit redundancy and E-trim fuse for known good die (集積回路)
- Realistic Scaling Scenario for Sub-100 nm Embedded SRAM Based on 3-Dimensional Interconnect Simulation(the IEEE International Conference on SISPAD '02)