Development of Novel System Combining Scanning Tunneling Microscope-Based Cathodoluminescence and Electroluminescence Nanospectroscopies
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概要
- 論文の詳細を見る
Novel system equipped with conductive optical fiber probe scanning tunneling microscope (STM) and bipolar sample holder is a powerful tool to characterize light-emitting devices by several STM-based techniques at the same sample position, which can realize photoluminescence (PL), cathodoluminescence (CL), electroluminescence (EL), and electron beam induced current (EBIC) measurements with higher spatial resolutions than conventional techniques. In this study, we developed a STM-CL/EL system which combines STM-CL technique for high CL excitation power and high spatial resolution and STM-EL technique for local EL collection. We demonstrated spatially resolved STM-CL/EL spectroscopy of GaAs/AlGaAs heterostructure (110) cross-sections.
- 2011-08-25
著者
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Watanabe Kentaro
Department Of Basic Science Graduate School Of Arts And Sciences The University Of Tokyo
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Ichikawa Masakazu
Department Of Physics Faculty Of Science And Engineering Waseda University
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Nakamura Yoshiaki
Graduate School Of Engineering Hokkaido University
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Onabe Kentaro
Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa, Chiba 277-8561, Japan
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Katayama Ryuji
Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa, Chiba 277-8561, Japan
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Kuboya Shigeyuki
Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa, Chiba 277-8561, Japan
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Ichikawa Masakazu
Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan
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Watanabe Kentaro
Department of Applied Physics, Graduate School of Engineering, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan
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