Critical Thickness for the Solid Phase Epitaxy : Si/Sb/Si(001)
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1996-09-15
著者
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ABUKAWA Tadashi
Research Institute for Scientific Measurements, Tohoku University
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KONO Shozo
Research Institute for Scientific Measurements, Tohoku University
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Goto Takaaki
Department Of Electric Engineering Tokyo University Of Agriculture And Technology
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Kono Shozo
Research Institute For Scientific Measurements Tohoku University
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Abukawa T
Tohoku Univ. Miyagi Jpn
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Abukawa Tadashi
Imram Tohoku University
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Abukawa Tadashi
Research Institute For Scientific Measurements Tohoku University
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KONO Shozo
IMRAM, Tohoku University
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GOTO Tadahiko
Research Institute for Scientific Measurements, Tohoku University
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OGURA Yasushi
Research Institute for Scientific Measurements, Tohoku University
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Ogura Yasushi
Research Institute For Scientific Measurements Tohoku University
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Ogura Yasushi
Research Center For Science Education National Institute For Educational Research
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後藤 俊夫
Imram Tohoku University
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Kono S
Imram Tohoku University
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