Trap Levels of Beryllium in Silicon
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1982-02-05
著者
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Hashimoto Kimio
Department Of Electrical Engineering Faculty Of Engineering Kyushu University
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Tomokage Hajime
Department Of Electrical Engineering Faculty Of Engineering Kyushu University
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HAGIWARA Muneyuki
Department of Electrical Engineering, Faculty of Engineering, Kyushu University
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Hagiwara Muneyuki
Department Of Electrical Engineering Faculty Of Engineering Kyushu University:(present Address) Nipp
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