Polarization of Electrons by Scattering, III Reflection-Transmission Effect
スポンサーリンク
概要
- 論文の詳細を見る
With electrons obliquely incident on a foil the intensities of the electrons scattered through a certain angle are different on the reflecting and on the transmitting side because of the plural scattering, and this phenomenon is called the reflection-transmission effect. This effect has been measured experimentally and compared with the calculation which is only a rough estimation. The experimental results obtained are in good agreement with the calculation at energies higher than 80 keV when thin gold foils are used. Since the plural scattering greatly influences the result of electron polarization experiment, the experimental results obtained previously by one of the authors (N.R.) must be corrected from this point of view. It is interesting to compare these corrected values with the theoretical ones obtained by Bartlett and Welton and recently by Mohr considering a nuclear screening by the orbital electrons, and by Bartlett and Watson using the pure Coulomb field. The agreement between experimental results and the corrected theoretical ones is not perfect, but it may be considered to be unavoidable that there are some differences between them, if one takes into account the fact that a small change in the nuclear screening makes a considerable effect on the theoretical values.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 1953-09-25
著者
-
Hashimoto Kimio
Department Of Electrical Engineering Faculty Of Engineering Kyushu University
-
Nonaka Itaru
Department Of Physics Chiba University
-
Ryu Norio
Department Of Applied Physics Faculty Of Engineering Hiroshima University
-
Nonaka Itaru
Department of Physics, Faculty of Science, Kyusyu University, Fukuoka
-
Ryu Norio
Department of Physics, Faculty of Science, Kyusyu University, Fukuoka
関連論文
- Aortico-pulmonary Paraganglioma : Case Report and Japanese Review
- Fusion of intussusceptum and intussuscipiens in intrauterine intussusception : A rare type of intestinal atresia
- The ^Fe(p,d)^Fe Reaction at 52 MeV
- The (p.t) Reaction on Even-Even Deformed Nuclei
- In-Diffusion and Annealing of Copper in Germanium
- Numerical Solutions of Basic Equations for Kick-Out Mechanism of Diffusion
- Diffusion Mechanism of Nickel and Point Defects in Silicon
- Criterions for Basic Assumptions in Kick-Out Mechanism of Diffusion
- Solid Solubility of Cobalt in Silicon
- A 160cm Synchro- and Variable Energy Ordinary Cyclotron
- Primary large cell neuroendocrine carcinoma of the urinary bladder
- Galvanomagnetic Effects in Bismuth Selenide Bi_2Se_3
- Electrical Properties of TlSe
- Diffusion Coefficient of Iron in Silicon at Room Temperature
- Developmental Abnormalities of Dendrites of the Cerebral Cortical Neurons in Mental Retardation
- Diffusion Coefficient of Cobalt in Silicon
- A Measurement of the Spin Correlation Coefficient C_ in p-p Scattering at 52 MeV
- Cellective States of ^Sn Excited by Inelastic Scattering of 14.695 MeV Protons
- The Reaction ^15(p, α)^12 in the Energy Range of Protons from 6.70 to 15.16MeV
- An Experimental Survey of Nuclear Reactions Induced by 57 MeV Protons : Part II (p, d) Reactions
- Elastic Scattering of Protons from Cu^ and Cu^ in the Energy Range from 7.54 MeV to 14.64 MeV
- An Experimental Survey of Nuclear Reactions Induced by 57 MeV Proton : Part I
- (α, p) Reactions near Z=26
- Elastic and Inelastic Scattering of Alpha Particles by Carbon
- Angular Distributions of Protons from the Reaction ^12(α,p)^N
- Energy Level and Solid Solubility of Cobalt in Silicon by In-Depth Profile Measurement
- Differential Method for Measuring Thermally Stimulated Capacitance
- Simple ICTS Measurement Method
- Note on the Analysis of DLTS and C^2-DLTS
- A New Method of Measuring the Ion Current of Mass Spectrometers
- Elastic and Inelastic Scattering of 55MeV Protons from ^60
- The Hole State by the Reactions ^Ca(p,d)^Ca, ^Cr(p,d)^Cr and ^Ni(p,d)^Ni
- Diffusion of Electrically-Active Cobalt in Silicon
- On the Neutrons from the N^(d, n) O^ Reaction-II
- On the Neutrons from the N^(d,n)O^ Reaction
- Alpha Particle Track Detection with Celluloid Films
- Trap Levels of Beryllium in Silicon
- Polarization of Electrons by Scattering, I
- Method of Analysis of a Single-Peak DLTS spectrum with Two Overlapping Deep-Trap Responses
- Atypical carcinoid of thymus associated with multiple endocrine neoplasia syndrome type 1
- MRI Finding of Chronic Hemorrhagic Empyema : A Case Report
- Electrical Properties of Stannous Telluride SnTe
- Electrical Properties of SnTe, SnSe and InBi at Low Temperatures
- Polarization of Electrons by Scattering, II
- Tritium Gas Target for T(d,n)He^4 Reaction
- Annealing of Supersaturated Cobalt in Silicon
- Counting Losses of Long Beaded Counters for X-Ray Measurements
- Health-related Quality of Life in Patients with Idiopathic Pulmonary Fibrosis -Cross-sectional and Longitudinal Study-
- Deep Impurity Levels of Cobalt in Silicon
- Polarization of Electrons by Scattering, III Reflection-Transmission Effect
- Polarization of Electrons by Scattering, IV