An Improved Method to Determinethe Capture Cross-section of Majority Carriers from the Pulse-Filling Measurement
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概要
- 論文の詳細を見る
A method is proposed to determine the capture cross-section of majority carriers from a change in the capacitance due to trap filling without any influence of slow capture in the depletion edge region. The difference in the capacitance under two bias conditions is measured by microcomputer-based isothermal capacitance transient spectroscopy. The capture cross-section of an electron on Au-acceptor level in Si is obtained to verify this method.
- 社団法人応用物理学会の論文
- 1988-04-20
著者
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Tomokage Hajime
Department Of Electrical Engineering Faculty Of Engineering Kyushu University
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Miyamoto Tokuo
Department Of Electronics Engineering And Computer Science Faculty Of Engineering Fukuoka University
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Miyamoto Tokuo
Department Of Electronics Engineering Fukuoka University
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Morita Shunya
Department Of Electrical Engineering And Computer Science Faculty Of Engineering Yamanashi Universit
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Morita Shunya
Department Of Electronics Engineering Fukuoka University
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