Raman Scattering and Photoluminescence Tomography : Techniques, Instrumentations and Measurement
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概要
- 論文の詳細を見る
Frequency shift and intensity of Raman scattering and photoluminescence are replicas of characteristic modes and concentration of impurities and/or defects in bulks, by which we can detect and analyze materials. Since their two dimensional mapping is very effective in characterizing materials, a microscope with a high resolution spectrometer is designed and developed by "streak-camera method " rather than the "flying spot method " usually used. Here, a specimen to be examined is moved in one direction only; that is, perpendicular to both the entrance slit and the optical axis of a spectrometer installed in the instrument. Some results obtained in a KDP (KH_2PO_4) crystal suggested the importance of transition regions between seed and crystal grown epitaxially on the seed.
- 社団法人応用物理学会の論文
- 1988-06-20
著者
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Ogawa Tomoya
Department Of Agricultural Chemistry Faculty Of Agriculture The University Of Tokyo
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Watanabe Masahito
Department Of Anatomy And Cell Biology Osaka Medical College
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Watanabe Masahito
Department Of Physics Gakushuin University
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WATANABE Masahito
Department of Agricultural and Biological Chemistry, College of Bioresource Sciences, Nihon University
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