A New, Simple Arrangement for Conoscopic Figures
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1984-11-20
著者
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Ohtsuka Ken-ichi
Department Of Physics Gakushiuin University
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Ara Haruya
Department of Physics, Gakushiuin University
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Ogawa Tomoya
Department of Physics, Gakushiuin University
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Ogawa Tomoya
Department Of Agricultural Chemistry Faculty Of Agriculture The University Of Tokyo
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Ara Haruya
Department Of Physics Gakushiuin University
-
Ogawa Tomoya
Department Of Physics Gakushiuin University
-
Ohtsuka Ken-ichi
Department of Electrical and Computer Engineering. Nagoya Institute of Technology
関連論文
- A New, Simple Arrangement for Conoscopic Figures
- A Study on IR Light Intensities Scattered from Defects in an Indum-Doped Liquid Encapsulaled Czochralski GaAs Crystals as Functions of Wavelength and Intensity of Bias Light Superposed on the Defects
- Observation of Lattice Defects in GaAs and Heat-treated Si Crystals by Infrared Light Scattering Tomography
- Correlation between Infrared-Light Scattering and Absorption Images in an In-Doped LEC GaAs Crystal
- A Comment on Defects in GaAs Crystals Observed by Infrared Light Scattering Tomography and IR Absorption Microscopy
- B-10-5 Synthesis of Substances related to Gibberellins(Terpenoids)
- Measurement of Stress near Dislocation Walls in a ZnSe Signal Crystal by Raman Scattering Tomography
- X-Ray Diffraction Microscopy by an Electronic Streak Camera System : Techniques, Instrumentations and Measurement
- Electrical Conductivity Measurement by Acoustic Attenuationin Semi-Insulating GaAs Crystals
- Effect of Depolarization Field on Electro-Elastic Properties of Photoconductive CdS Crystals (Experimental)
- Dependence of Piezoelectric Constant of Evaporated CdS Thin Films upon Their Deposition Rate
- Anelasticity in an Mn-Ferrite Single Crystal
- Origin of the High Field Domains in Piezoelectric Semiconductors : A phenomenological Theory
- Raman Scattering and Photoluminescence Tomography : Techniques, Instrumentations and Measurement
- A Linear Chain Model for Piezoelectricity in Zincblende and Wurtzite Type Crystals
- Some New Aspects of the Anomalous Photovoltaic Effect in ZnS Crystals
- A Phenomenological Analysis of Crystal Growth from Solutions as an Irreversible Proeess
- Acoustic Losses in Single Crystals of Mn-Zn Ferrite and Titanium Substituted Mn-Zn Ferrites
- Effect of Depolarization Field on Electromechanical Properties of Piezoelectric Semiconductors (Theory)
- Decrement of Piezoelectric Constants Caused by Screening Effect of Conduction Electrons on the Effective Charge of CdS Crystals
- New Interference Fringes Generated by Epitaxial Layers of Semiconductors and SIMOX (Oxygen-Ion-Implanted-Si) Wafers
- Characterization of Epitaxially Grown Semiconductive Layers by Scattering of Optical Pseudo-Surface Waves and Interference Fringes due to Guided Waves within the Layers
- Determination of Tiny Scatterer's Shape by Light Scattering Tomography
- 5th Rank Piezoelectric Tensors in Tellurium Single Crystals
- A Proposal for Measurement of Implanted Ion Dose in Semiconductor Wafers by IR Light Scattering Technique : Semiconductors and Semiconductors Devices
- Improvements in Quadriceps Force and Work Efficiency are Related to Improvements in Endurance Capacity Following Pulmonary Rehabilitation in COPD Patients
- Estimation of the Spontaneous Polarization of Hexagonal ZnS, CdS and ZnO Crystals
- Study of Inhomogeneous Radial Distribution of Defects in As-grown and Annealed Czochralski Silicon Crystals by Multi-chroic Infrared Light Scattering Tomography
- Study of the Characteristics of Defects in the Oxidation-induced Stacking Fault-Ring Area in Czochralski Silicon Crystals by Multi-chroic Infrared Light Scattering Tomography and Transmission Electron Microscopy