New Method for Noncontact Atomic Force Microscopy Image Simulations
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概要
- 論文の詳細を見る
We developed a new method of numerical simulation for noncontact atomic force microscopy (nc-AFM) images. This method works as a mapping filter from the tip-surface interaction force into the nc-AFM images. First we present a new method for image simulations. Next we apply this method to the simulation of nc-AFM images of a Si (111) 7×7 reconstructed surface. Thus it is determined that our method works well as an image simulator.
- 社団法人応用物理学会の論文
- 1999-01-15
著者
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SASAKI Nobuyoshi
Device Analysis and Evaluation Technology Center, NEC Corporation
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Sasaki N
Toshiba Corp. Yokohama Jpn
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Tsukada Masaru
Department Of Nano-science And Nano-technology Advanced School Of Science And Engineering Waseda Uni
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Sasaki Naruo
Department Of Materials And Life Sciences Faculty Of Science And Technology Seikei University
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Sasaki Naruo
Department Of Physics Graduate School Of Science University Of Tokyo
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Sasaki Norihiko
Department Of Nuclear Engineering Faculty Of Engineering Tohoku University:(present Address) Manufac
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Tsukada Masaru
Department of Nano-Science and Nano-Engineering, Waseda University, 513 Waseda Tsurumaki-cho, Shinjuku-ku, Tokyo 162-0041, Japan
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Sasaki Naruo
Department of Applied Physics, Faculty of Engineering, Seikei University, Kichijoji Kitamachi 3-3-1, Musashino-shi, Tokyo 180-8633, Japan
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