Fourier Expansion Method for Noncontact Atomic Force Microscopy Image Simulations : Application to Si(111)√<3> × √<3>-Ag Surface

概要

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A Fourier expansion method is proposed to simulate noncontact atomic force microscopy images. The three-dimensional distribution of the tip-surface interaction force obtained by the first-principles density functional calculations is efficiently used for calculating frequency shifts of the resonant frequency. The two-dimensional periodicity of the surface, which is the basis of this method, can be rigorously described. For a case study of this method, we theoretically simulate noncontact atomicforce microscopy(NC-AFM)images of a Si(111)√<3> × √<3> R 30°-Ag rigid surface with the first-principles density functional calculation. Force spectroscopies and AFM images for different tip heights are calculated.
社団法人応用物理学会の論文
2000-02-15