Interpretation of Frictiomal-Force Microscopy Images Based on the Two-Dimensional Stick-Slip Motion of the Tip Atom
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概要
- 論文の詳細を見る
Frictional-force microscopy (FFM) images of graphite are calculated by a numerical simulation using a static model. We find that a remarkable trarnsition of the FFM image pattern occurs depending on the cantilever stiffness. This image transition is interpreted based on the two-dimensional stick-slip motion of the tip atom. It is clarified that the frictional force image pattern reflects two kinds of tip atom motion: 1) straight motion and 2) zigzag motion.
- 社団法人応用物理学会の論文
- 1996-06-30
著者
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Tsukada Masaru
Department Of Nano-science And Nano-technology Advanced School Of Science And Engineering Waseda Uni
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Kobayashi Katsuyoshi
Department Of Physics Faculty Of Science University Of Tokyo
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Sasaki Naruo
Department Of Materials And Life Sciences Faculty Of Science And Technology Seikei University
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Sasaki Naruo
Departnnent Of Physics Graduate School Of Science University Of Tokyo
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Tsukada Masaru
Departnnent Of Physics Graduate School Of Science University Of Tokyo
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KOBAYASHI Katusuyoshi
Departnnent of Physics, Graduate School of Science, University of Tokyo
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Kobayashi Katusuyoshi
Departnnent Of Physics Graduate School Of Science University Of Tokyo
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Sasaki Naruo
Department Of Materials And Life Science Faculty Of Science And Technology Seikei University
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Tsukada Masaru
Department of Nano-Science and Nano-Engineering, Waseda University, 513 Waseda Tsurumaki-cho, Shinjuku-ku, Tokyo 162-0041, Japan
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Sasaki Naruo
Department of Applied Physics, Faculty of Engineering, Seikei University, Kichijoji Kitamachi 3-3-1, Musashino-shi, Tokyo 180-8633, Japan
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Kobayashi Katsuyoshi
Department of Electrochemistry, Faculty of Engineering, Yokohama National University
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