SIM-13 SIMULATION OF PICO-FORCE DETECTION IN LATERAL-MODE DYNAMIC AFM(Simulations of Micro/Nano Scale Phenomena IV,Technical Program of Oral Presentations)
スポンサーリンク
概要
- 論文の詳細を見る
We have developed an empirical simulator of the dynamic lateral force microsocpy (DLFM) regulated by scanning tunneling microscopy (STM). This STM/DLFM simulator is applied to simulate the small-amplitude STM/DLFM of the Si(111) 7×7 reconstructed surface. Effects of the dithering amplitude A_<dith> on the STM and DLFM images are simulated and compared with experiments. The simulated two-dimentional patterns of the STM and DLFM images are in good agreement with the experimental ones.
- 2009-06-17
著者
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Kawai Shigeki
Institute Of Industrial Science University Of Tokyo:jst-crest:department Of Physics University Of Ba
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Kawakatsu Hideki
Institute Of Industrial Science University Of Tokyo:jst-crest
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Kawakatsu Hideki
Institute Of Industrial Science The University Of Tokyo
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Sasaki Naruo
Department Of Materials And Life Sciences Faculty Of Science And Technology Seikei University
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Sasaki Naruo
Department Of Materials And Life Science Faculty Of Science And Technology Seikei University
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Sasaki Naruo
Department of Applied Physics, Faculty of Engineering, Seikei University, Kichijoji Kitamachi 3-3-1, Musashino-shi, Tokyo 180-8633, Japan
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