Twisted Non-Circular Coil System in a Toroidal Helical Axis Stellarator
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1986-06-20
著者
-
SASAKI Nobuyoshi
Device Analysis and Evaluation Technology Center, NEC Corporation
-
Sasaki N
Toshiba Corp. Yokohama Jpn
-
SASAKI Norihiko
Department of Nuclear Engineering,Faculty of Engineering,Tohoku University
-
HARAFUJI Kenji
Department of Nuclear Engineering,Faculty of Engineering,Tohoku University
-
Harafuji Kenji
Department Of Nuclear Engineering Faculty Of Engineering Tohoku University:(present Address) Institu
-
Harafuji Kenji
Department Of Nuclear Engineering Faculty Of Engineering Tohoku University
-
Sasaki Norihiko
Department Of Nuclear Engineering Faculty Of Engineering Tohoku University:(present Address) Manufac
-
Harafuji Kenji
Department of Electrical and Electronic Engineering, Ritsumeikan University, 1-1-1 Noji-Higashi, Kusatsu, Shiga 525-8577, Japan
関連論文
- Influence of Annealing on Molecular Orientation of Rubbed Polyimide Film Observed by Reflection Ellipsometry
- Phase Breaking of Coherent Electron Waves in Dot Array Systems ( Quantum Dot Structures)
- Trajectory Transition Due to Gate Depletion in Corrugation Gated Quantum Wires
- Beta Limit for a System with a Closed Helical Magnetic Axis
- Study of Single Charged Particle Motion in a Toroidal System with a Three Dimensional Magnetic Axis
- Design Study of Modular Coil System in a Toroidal Helical Axis Stellarator
- Toroidal Effect on Magnetic Line of Force in Non-Planar Helical Magnetic Axis System (Asperator NP-3)
- Velocity Space Loss Region in a Toroidal System with a Non-Planar Magnetic Axis
- Twisted Non-Circular Coil System in a Toroidal Helical Axis Stellarator
- Molecular Dynamics of Ion Incident Angle Dependence of Sputtering Yield in Chlorine-Adsorbed GaN Crystal
- Submicron 3-Dimensional Structure Observation by Cyclotron SEM(Scanning Electron Microscope) : Inspection and Testing
- Submicron 3-Dimensional Structure Observation by Cyclotron SEM(Scanning Electron Microscope)
- A Novel High-Resolution Scanning Electron Microscope for the Surface Analysis of High-Aspect-Ratio Three-Dimensional Structures
- New Method for Noncontact Atomic Force Microscopy Image Simulations
- Chemical Sputtering of GaN Crystal with a Chlorine-Adsorbed Layer
- Air-stable inverted organic solar cells with pentacene anode buffer layer
- Point Defects Induced by Physical Sputtering in Wurtzite-Type GaN Crystal
- Cathode Work Function Dependence of Electron Transport Efficiency through Buffer Layer in Organic Solar Cells
- Attempt to Suppress S-Shaped Kink in Current--Voltage Characteristics in Organic Solar Cells
- Addendum to Study of Single Charged Particle Motion in a Toroidal System with aThree Dimensional Magnetic Axis [53(1984)601]