MRAM Writing Circuitry to Compensate for Thermal Variation of Magnetization Reversal Current
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概要
- 論文の詳細を見る
MRAM-writing circuitry to compensate for the thermal variation of the magnetization-reversal current is proposed. The writing current of the proposed circuitry is designed to decrease in proportion to an increase in temperature. This technique prevents multiple-write failures from degrading 1 Gb MRAM yield where the standard deviation of magnetization-reversal current variation from other origins is less than 5%.
- 社団法人電子情報通信学会の論文
- 2003-04-01
著者
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本田 雄士
日本電気(株)システムデバイス研究所
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本田 雄士
Nec基礎研究所
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Honda T
System Devices Research Laboratories Nec Corporation
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HONDA Takeshi
The authors are with Silicon System Research Laboratories, NEC Corporation
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SAKIMURA Noboru
The authors are with Silicon System Research Laboratories, NEC Corporation
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SUGIBAYASHI Tadahiko
The authors are with Silicon System Research Laboratories, NEC Corporation
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NUMATA Hideaki
The authors are with Silicon System Research Laboratories, NEC Corporation
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MIURA Sadahiko
The authors are with Silicon System Research Laboratories, NEC Corporation
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HADA Hiromitsu
The authors are with Silicon System Research Laboratories, NEC Corporation
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TAHARA Shuichi
The authors are with Silicon System Research Laboratories, NEC Corporation
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Hada H
System Devices Research Laboratories Nec Corporation
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Hada Hiromitsu
Nec Corporation Device Platforms Research Laboratories
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Hada Hiromitsu
Silicon Systems Research Laboratories Nec Corporation
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Numata Hideaki
The Authors Are With Silicon System Research Laboratories Nec Corporation
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Numata Hideaki
The Authors Are With Fundamental Research Laboratories System Devices And Fundamental Research Nec C
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Miura Sadahiko
The Authors Are With Silicon System Research Laboratories Nec Corporation
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Tahara S
System Devices Research Laboratories Nec Corporation
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Tahara Shuichi
The Authors Are With Fundamental Research Laboratories System Devices And Fundamental Research Nec C
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Sakimura Noboru
System Devices Research Laboratories Nec Corporation
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Sakimura Noboru
Device Platforms Laboratories Nec Corporation
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Honda T
Fukuoka Univ. Fukuoka Jpn
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Sugibayashi T
Device Platforms Laboratories Nec Corporation
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Sugibayashi Tadahiko
Nec Corporation Device Platforms Research Laboratories
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