A 25kV ESD Proof LDMOSFET with a Turn-on Discharge MOSFET
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概要
- 論文の詳細を見る
This paper proposes an LDMOSFET(Lateral Double-diffused MOSFET)that has the robustness against the hardest ESD(Electrostatic Discharge)requirement for automobile ECUs(Electronic Control Units)of discharging 25kV 150pF through 150 ohm 1μH without external protecting circuits. The basic idea to achieve this is to add a novel discharge circuit to an LDMOSFET, which turns on when Human Body Model(HBM)type ESD is applied, and to consume the discharge energy in SOA(Safe Operating Area)in the LDMOSFET, avoiding localized current crowding of a parasitic bipolar transistor which causes the conventional ESD device failure. First, dynamics of current crowding when a grounded gate LDMOSFET is exposed to ESD stress is described by means of a circuit level SPICE simulation on a parallel distributed device model. Then a novel ESD turn-on LDMOSFET with a discharge MOSFET is proposed, which has ESD robustness of 25kV. Finally the ESD measurements of the new device are shown to be in good accordance with estimation and to satisfy the target.
- 社団法人電子情報通信学会の論文
- 2001-06-01
著者
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Fujino S
Denso Corp. Aichi‐ken Jpn
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Fujino S
Electronics Device R&d Center Denso Corporation
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Shirakawa Isao
Department Of Information System Engineering Graduate School Of Engineering Osaka University
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Shirakawa Isao
Osaka University
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Fujino Seiji
Electronics Device R&d Center Denso Corporation
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Shirakawa I
Graduate School Of Applied Informatics University Of Hyogo
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KAWAMOTO Kazunori
DENSO CORPORATION
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KOHNO Kenji
DENSO CORPORATION
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HIGUCHI Yasushi
DENSO CORPORATION
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FUJINO Seiji
DENSO CORPORATION
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YAMAGUCHI Hitoshi
DENSO CORPORATION
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Yamaguchi H
Nec Corp. Sagamihara‐shi Jpn
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Higuchi Y
Electronics Device R&d Center Denso Corporation
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Higuchi Yasushi
Electronics Device R&d Center Denso Corporation
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Kawamoto K
Electronics Device R&d Center Denso Corporation
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